IP Library › Patent Application 62425602
Patent Application Provisional
App. No. 62/425,602 · Confirmation No. 1023

Inter-Layer Defect Inspection - Wafer Noise Reduction by Image Subtraction Across Layers

Inventor: Bjorn Brauer
Provisional Application Expired
⬇ PDF
 Code Description Pages PDF
2016-12-01 APP.FILE.REC Filing Receipt 3 View
2016-11-22 TR.PROV Provisional Cover Sheet (SB16) 3 View
2016-11-22 SPEC Specification 5 View
2016-11-22 WFEE Fee Worksheet (SB06) 2 View
2016-11-22 N417 Electronic Filing System Acknowledgment Receipt 2 View
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Quick Facts
App. No.
62/425,602
Filed
2016-11-22