Patent Assignment
Reel/Frame 044365/0085
Assignment of Assignor's Interest
Recorded: 2017-12-12
Pages: 4
Assignors
TAKAGI, YUJI
Executed: 2017-11-22
HARADA, MINORU
Executed: 2017-11-22
HIRAI, TAKEHIRO
Executed: 2017-11-22
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-8717, JAPAN
Covered Property
(1)
Defect Image Classification Device and Defect Image Classification Method
Application:
15/579,047 →
Publication:
US 2018/0174000
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.