Patent Assignment
Reel/Frame 044720/0019
Merger
Recorded: 2018-01-24
Pages: 5
Assignor
REVERA INCORPORATED
Executed: 2017-11-08
Assignee
NOVA MEASURING INSTRUMENTS INC.
3090 OAKMEAD VILLAGE DRIVE, SANTA CLARA, CALIFORNIA, 95051
Covered Properties
(10)
Direct Imaging Monochromatic Electron Microscope
Patent:
4,810,880 →
Application:
07/058,437 →
Energy and Analysis Detection System for Surface Chemical Analysis
Patent:
4,737,639 →
Application:
07/063,806 →
Resistive Anode Encoder Target and Method Producing Both Charged and Visual Images
Patent:
5,025,144 →
Application:
07/254,442 →
Direct Imaging Monochromatic Electron Microscope
Patent:
4,882,487 →
Application:
07/268,440 →
Particle Analyzer Apparatus and Method
Patent:
5,128,543 →
Application:
07/425,568 →
Plasma Etching Method and Apparatus
Patent:
5,167,748 →
Application:
07/579,331 →
Apparatus and Method for Locating Target Area for Electron Micro- Analysis
Patent:
5,118,941 →
Application:
07/690,870 →
Mechanism for Positioning a Carrier
Patent:
5,184,525 →
Application:
07/869,561 →
Focused Ion Beam Column with Electrically Variable Blanking Aperture
Patent:
5,637,879 →
Application:
08/618,599 →
Electronic Device Incorporating a Multilayered Capacitor Formed on a Printed Circuit Board
Patent:
7,561,438 →
Application:
11/023,271 →
Related Assignments
(2)
Other recorded transfers of the patents in this record — the chain of ownership.