Patent Assignment
Reel/Frame 035333/0150
Release of Security Interest
Recorded: 2015-04-03
Pages: 5
Assignor
SILICON VALLEY BANK
Executed: 2015-04-03
Assignee
REVERA INCORPORATED
3090 OAKMEAD VILLAGE DRIVE, SANTA CLARA, CALIFORNIA, 95051
Covered Properties
(35)
Direct Imaging Monochromatic Electron Microscope
Patent:
4,810,880 →
Application:
07/058,437 →
Energy and Analysis Detection System for Surface Chemical Analysis
Patent:
4,737,639 →
Application:
07/063,806 →
Resistive Anode Encoder Target and Method Producing Both Charged and Visual Images
Patent:
5,025,144 →
Application:
07/254,442 →
Direct Imaging Monochromatic Electron Microscope
Patent:
4,882,487 →
Application:
07/268,440 →
Particle Analyzer Apparatus and Method
Patent:
5,128,543 →
Application:
07/425,568 →
Multichannel Charged-Particle Analyzer
Patent:
5,032,724 →
Application:
07/565,289 →
Plasma Etching Method and Apparatus
Patent:
5,167,748 →
Application:
07/579,331 →
Apparatus and Method for Locating Target Area for Electron Micro- Analysis
Patent:
5,118,941 →
Application:
07/690,870 →
Suspension System for Isolating Vibrations
Patent:
5,213,301 →
Application:
07/809,691 →
Apparatus for Retaining an Electrode by a Magnetically Shielded Magnet
Patent:
5,218,262 →
Application:
07/863,640 →
Mechanism for Positioning a Carrier
Patent:
5,184,525 →
Application:
07/869,561 →
Scanning and High Resolution X-Ray Photoelectron Spectroscopy and Imaging
Patent:
5,315,113 →
Application:
07/953,429 →
Method and Apparatus for Control of Surface Potential
Patent:
5,432,345 →
Application:
07/958,249 →
Scanning and High Resolution Electron Spectroscopy and Imaging
Patent:
5,444,242 →
Application:
08/201,912 →
Anode Assembly for Generating X-Rays and Instrument with Such Anode Assembly
Patent:
5,602,899 →
Application:
08/593,308 →
Focused Ion Beam Column with Electrically Variable Blanking Aperture
Patent:
5,637,879 →
Application:
08/618,599 →
Control of Surface Potential of Insulating Specimens in Surface Analysis
Patent:
5,990,476 →
Application:
08/968,454 →
Nondestructive Characterization of Thin Films Based on Acquired Spectrum
Nondestructive Characterization of Thin Films Using Measured Basis Spectra
System and Method for Depth Profiling and Characterization of Thin Films
Electronic Device Incorporating a Multilayered Capacitor Formed on a Printed Circuit Board
Patent:
7,561,438 →
Application:
11/023,271 →
Semiconductor Substrate Processing Method and Apparatus
Determining Layer Thickness Using Photoelectron Spectroscopy
Techniques for Analyzing Data Generated by Instruments
Method and System for Non-Destructive Distribution Profiling of an Element in a Film
Diamond Anode
Patent:
7,359,487 →
Application:
11/228,685 →
Photoelectron Spectroscopy Apparatus and Method of Use
Calibrating Multiple Photoelectron Spectroscopy Systems
Patent:
7,456,399 →
Application:
11/395,189 →
Method and System for Non-Destructive Distribution Profiling of an Element in a Film
Method and System for Calibrating an X-Ray Photoelectron Spectroscopy Measurement
Semiconductor Substrate Processing Method and Apparatus
Method and System for Non-Destructive Distribution Profiling of an Element in a Film
Method and Discovery System for Discovering Encrypted Peer-to-Peer (EP2P) Nodes Associated with a Particular EP2P Network
Patent:
8,510,548 →
Application:
13/244,084 →
Method and System for Non-Destructive Distribution Profiling of an Element in a Film
Method and System for Calibrating an X-Ray Photoelectron Spectroscopy Measurement
Application:
61/048,811 →
Related Assignments
(4)
Other recorded transfers of the patents in this record — the chain of ownership.
Release of Security Interest
Mar 31, 2015
From: VENTURE LENDING & LEASING V, LLC
To: REVERA INCORPORATED
Reel/Frame 035299/0001 →
Merger
Jan 23, 2018
From: REVERA INCORPORATED
To: NOVA MEASURING INSTRUMENTS INC.
Reel/Frame 044706/0656 →
Merger
Jan 24, 2018
From: REVERA INCORPORATED
To: NOVA MEASURING INSTRUMENTS INC.
Reel/Frame 044720/0019 →
Merger
Feb 21, 2018
From: REVERA INCORPORATED
To: NOVA MEASURING INSTRUMENTS INC.
Reel/Frame 044990/0829 →