Patent Assignment
Reel/Frame 044706/0656
Merger
Recorded: 2018-01-23
Pages: 5
Assignor
REVERA INCORPORATED
Executed: 2017-11-08
Assignee
NOVA MEASURING INSTRUMENTS INC.
3090 OAKMEAD VILLAGE DRIVE, SANTA CLARA, CALIFORNIA, 95051
Covered Properties
(10)
Multichannel Charged-Particle Analyzer
Patent:
5,032,724 →
Application:
07/565,289 →
Scanning and High Resolution X-Ray Photoelectron Spectroscopy and Imaging
Patent:
5,315,113 →
Application:
07/953,429 →
Scanning and High Resolution Electron Spectroscopy and Imaging
Patent:
5,444,242 →
Application:
08/201,912 →
Anode Assembly for Generating X-Rays and Instrument with Such Anode Assembly
Patent:
5,602,899 →
Application:
08/593,308 →
Control of Surface Potential of Insulating Specimens in Surface Analysis
Patent:
5,990,476 →
Application:
08/968,454 →
Nondestructive Characterization of Thin Films Based on Acquired Spectrum
Nondestructive Characterization of Thin Films Using Measured Basis Spectra
System and Method for Depth Profiling and Characterization of Thin Films
Semiconductor Substrate Processing Method and Apparatus
Semiconductor Substrate Processing Method and Apparatus
Related Assignments
(3)
Other recorded transfers of the patents in this record — the chain of ownership.
Security Interest
Jul 22, 2014
From: REVERA INCORPORATED
To: SILICON VALLEY BANK
Reel/Frame 033378/0598 →
Release of Security Interest
Mar 31, 2015
From: VENTURE LENDING & LEASING V, LLC
To: REVERA INCORPORATED
Reel/Frame 035299/0001 →
Release of Security Interest
Apr 3, 2015
From: SILICON VALLEY BANK
To: REVERA INCORPORATED
Reel/Frame 035333/0150 →