Patent Assignment
Reel/Frame 044994/0789
Merger
Recorded: 2018-02-21
Pages: 5
Assignor
REVERA INCORPORATED
Executed: 2017-11-08
Assignee
NOVA MEASURING INSTRUMENTS INC.
3090 OAKMEAD VILLAGE DRIVE, SANTA CLARA, CALIFORNIA, 95051
Covered Properties
(8)
Diamond Anode
Patent:
7,359,487 →
Application:
11/228,685 →
Calibrating Multiple Photoelectron Spectroscopy Systems
Patent:
7,456,399 →
Application:
11/395,189 →
Method and System for Calibrating an X-Ray Photoelectron Spectroscopy Measurement
System and Method for Characterizing a Film by X-Ray Photoelectron and Low-Energy X-Ray Fluorescence Spectroscopy
Methods and Systems for Fabricating Platelets of a Monochromator for X-ray Photoelectron Spectroscopy
Methods and Systems for Measuring Periodic Structures Using Multi-Angle X-Ray Reflectance Scatterometry (Xrs)
Silicon Germanium Thickness and Composition Determination Using Combined Xps and Xrf Technologies
Feed-Forward of Multi-Layer and Multi-Process Information using XPS and XRF Technologies
Related Assignments
(6)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Aug 11, 2014
From: FANTON, JEFFREY T.; SMEDT, RODNEY; SCHUELER, BRUNO W.; REED, DAVID A.
To: REVERA, INCORPORATED
Reel/Frame 033508/0595 →
Assignment of Assignor's Interest
Nov 12, 2014
From: POIS, HEATH A.; REED, DAVID A.; SCHUELER, BRUNO W.; SMEDT, RODNEY
To: REVERA, INCORPORATED
Reel/Frame 034159/0765 →
Release of Security Interest
Mar 31, 2015
From: VENTURE LENDING & LEASING V, LLC
To: REVERA INCORPORATED
Reel/Frame 035299/0001 →
Release of Security Interest
Apr 3, 2015
From: SILICON VALLEY BANK
To: REVERA INCORPORATED
Reel/Frame 035333/0150 →
Assignment of Assignor's Interest
Apr 21, 2015
From: POIS, HEATH A.; LEE, WEI TI
To: REVERA, INCORPORATED
Reel/Frame 035461/0429 →
Assignment of Assignor's Interest
Feb 15, 2017
From: POIS, HEATH A.; LEE, WEI TI; BOT, LAWRENCE V.; KWAN, MICHAEL C.
To: REVERA, INCORPORATED
Reel/Frame 041263/0447 →