IP Library › Assignment 045457/0888
Patent Assignment
Reel/Frame 045457/0888

Assignment of Assignor's Interest

Recorded: 2018-04-06 Pages: 2
Assignors
SHIGENO, MASATSUGU
Executed: 2018-03-01
WATANABE, KAZUTOSHI
Executed: 2018-03-01
YAMAMOTO, HIROYOSHI
Executed: 2018-03-01
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-0003, JAPAN
Covered Property (1)
Scanning Probe Microscope and Scanning Method Thereof
Application: 15/937,306 →
Publication: US 2018/0284151
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072905/0225 →
Chnage of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072909/0725 →