Patent Assignment
Reel/Frame 072905/0225
Change of Name
Recorded: 2025-09-17
Pages: 12
Assignor
HITACHI HIGH-TECH SCIENCE CORPORATION
Executed: 2025-04-01
Assignee
HITACHI HIGH-TECH ANALYSIS CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU, TOKYO, 105-6411, JAPAN
Covered Properties
(50)
Unknown Sample Determining Method, Unknown Sample Determining Instrument, and Unknown Sample Determining Program
Composite Beam Apparatus
X-Ray Inspection Method and X-Ray Inspection Device
Charged Particle Beam Apparatus and Method for Controlling Charged Beam Apparatus
Charged Particle Beam Apparatus
Icp Emission Spectrophotometer
Ion Beam Apparatus
Charged Particle Beam Apparatus
Charged Particle Beam Apparatus
Sample Holder, Member Mounting Device, and Charged Particle Beam Apparatus
Charged Particle Beam Apparatus
Portable Information Terminal, Beam Irradiation System, and Program
Scanning Probe Microscope and Scanning Method Thereof
Method of Burying Sample Trench
Method for Acquiring Image and Ion Beam Apparatus
Apparatus for and Method of Mass Analysis
Fluorescence Spectrophotometer and Fluorescence Spectrometry and Imaging Method
Apparatus for and Method of Mass Analysis
Mass Analysis Apparatus and Method
Apparatus and Method for Analyzing Evolved Gas
Radiation Analysis Apparatus
Analyzing Apparatus and Analyzing Method
Thermostatic Apparatus and Analytical Apparatus Including the Same
Chromatographic Data System Processing Apparatus
Automatic Sample Preparation Apparatus
Chromatographic Data System Processing Apparatus
Charged Particle Beam Apparatus
Sample Analysis System, Display Method, and Sample Analysis Method
Cross Section Processing Observation Method and Charged Particle Beam Apparatus
Ion Source and Electron Source Having Single-Atom Termination Structure, Tip Having Single-Atom Termination Structure, Gas Field Ion Source, Focused Ion Beam Apparatus, Electron Source, Electron Microscope, Mask Repair Apparatus, and Method of Manufacturing Tip Having Single-Atom Termination Structure
Apparatus for and Method of Mass Analysis
Scanning Probe Microscope
Two-Dimensional Liquid Chromatographic Analyzer
Composite Beam Apparatus
Plastic Reference Material and Method of Manufacturing the Same
Charged Particle Beam Apparatus and Sample Processing Observation Method
Charged Particle Beam Apparatus, and Method and Program for Limiting Stage Driving Range Thereof
Apparatus, Method, and Program for Processing and Observing Cross Section, and Method of Measuring Shape
Scanning Probe Microscope and Scanning Method Using the Same
Chromatographic Data System, Processing Apparatus, Chromatographic Data System Processing Method, and Chromatograph
Charged Particle Beam Device
Composite Charged Particle Beam Apparatus
Cross-Section Observation Device, and Control Method
Automatic Processing Device
X-Ray Transmission Inspection Apparatus and X-Ray Transmission Inspection Method
Chromatograph and Apparatus for Determining Chromatograph Analysis Method
Chromatograph Having Operation Controller That Causes Automatic Purging in a Case of Detection Failure
Charged Particle Beam Apparatus
Charged Particle Beam Apparatus and Sample Processing Observation Method
Thin-Sample-Piece Fabricating Device and Thin-Sample-Piece Fabricating Method
Related Assignments
(17)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Sep 6, 2017
From: ASAHATA, TATSUYA
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 043498/0941 →
Assignment of Assignor's Interest
Sep 6, 2017
From: HORIGOME, JUN; NAKAMURA, KOICHI; SATO, YOICHI; HOSEN, YUSUKE
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 043499/0679 →
Assignment of Assignor's Interest
Dec 21, 2017
From: SUZUKI, HIDEKAZU
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 044463/0808 →
Assignment of Assignor's Interest
Jan 15, 2018
From: TOMIMATSU, SATOSHI; SATO, MAKOTO; SUZUKI, MASATO
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 044623/0661 →
Assignment of Assignor's Interest
Jan 18, 2018
From: URANO, YUTA; ZHANG, KAIFENG; MATOBA, YOSHIKI; TAKEDA, AKIHIRO
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 044658/0981 →
Assignment of Assignor's Interest
Mar 28, 2018
From: IKKU, YUTAKA
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 045374/0082 →
Assignment of Assignor's Interest
Apr 5, 2018
From: HASUDA, MASAKATSU
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 045450/0958 →
Assignment of Assignor's Interest
Apr 5, 2018
From: IWAHORI, TOSHIYUKI
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 045451/0100 →
Assignment of Assignor's Interest
Apr 6, 2018
From: SHIGENO, MASATSUGU; WATANABE, KAZUTOSHI; YAMAMOTO, HIROYOSHI
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 045457/0888 →
Assignment of Assignor's Interest
Apr 10, 2018
From: ASO, TAKUMA; UEMOTO, ATSUSHI; ASAHATA, TATSUYA; SUZUKI, MASATO
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 045491/0280 →
Assignment of Assignor's Interest
Apr 10, 2018
From: IWAHORI, TOSHIYUKI
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 045491/0561 →
Assignment of Assignor's Interest
Apr 10, 2018
From: IWAHORI, TOSHIYUKI
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 045491/0677 →
Assignment of Assignor's Interest
Apr 11, 2018
From: TORIKAWA, SHOTA
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 045505/0018 →
Assignment of Assignor's Interest
Jul 25, 2018
From: HIROSE, RYUSUKE; AKIYAMA, HIDEYUKI; SAKAI, NORIAKI
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 046461/0687 →
Assignment of Assignor's Interest
Jul 25, 2018
From: HORIGOME, JUN; NAKAJIMA, RINO; SATO, YOICHI
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 046461/0964 →
Assignment of Assignor's Interest
Oct 29, 2018
From: MATSUBARA, SHINICHI; KAWANAMI, YOSHIMI; SHICHI, HIROYASU
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 047336/0572 →
Chnage of Address
Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072909/0725 →