IP Library Granted Patent US 10,989,642
Granted Patent B2
US 10,989,642 · App. 16/041,675 · Granted Apr 27, 2021

Apparatus for and method of mass analysis

Inventor: Masahiro Sakuta (Tokyo, JP)
Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
G01N5/04G01N25/48G01N30/8675G01N33/0049H01J49/0027H01J49/0031
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Quick Facts
Patent No.
US 10,989,642
App. No.
16/041,675
Granted
Apr 27, 2021
Kind
B2
Abstract

Disclosed is an apparatus for and a method of mass analysis in which a presence of an accessory substance which is difficult to be analyzed can be recognized visually and clearly. The apparatus for mass analysis analyzes a sample containing a substance to be measured and includes: a display unit; a memory unit storing a theoretical peak obtained by calculation with respect to a region of a mass spectrum of the substance; a matching degree calculation unit calculating a matching degree from multiple peaks that each of the mass spectrum of the sample in the region and the theoretical peak have; a matching degree displaying control unit displaying the matching degree on the display unit; and a superimposition displaying control unit displaying the mass spectrum of the sample and the theoretical peak in a superimposed way in a manner that is consistent with a mass-to-charge ratio.

Claims (18)

1. An apparatus for mass analysis, the apparatus analyzing a sample containing a substance to be measured and comprising: a display unit; a memory unit storing a theoretical peak obtained by calculation with respect to a region of a mass spectrum of the substance; a matching degree calculation unit calculating a matching degree from multiple peaks that each of the mass spectrum of the sample in the region and the theoretical peak have, the matching degree representing degree of matching between the mass spectrum of the sample and theoretical peak; a matching degree displaying control unit displaying

the matching degree on the display unit; and

a superimposition displaying control unit displaying the mass spectrum of the sample and the theoretical peak in a superimposed way in a manner that is consistent with a mass-to-charge ratio.

2. The apparatus of claim 1 , wherein the matching degree displaying control unit compares the matching degree and a

predetermined first threshold value with each other, and displays a presence of the substance on the display unit.

3. The apparatus of claim 1 , wherein the matching degree calculation unit sums up intensities of the mass spectrum of the sample each corresponding to a same mass-to-charge ratio

of the theoretical peak to calculate a intensities, and

sum of the

the matching degree displaying control unit displays the sum of the intensities on the display unit.

4. The apparatus of claim 1 , wherein the matching degree displaying control unit compares the sum of the intensities and a predetermined second threshold value, and displays a reliability of the presence of the substance on the display unit.

5. The apparatus of claim 1 , wherein the matching degree calculation unit calculates the matching degree on the basis of an average value of the intensities of the mass spectrum of the sample in a predetermined range of the theoretical peak.

6. The apparatus of claim 1 , wherein the superimposition displaying control unit displays an intensity of the maximum peak of the theoretical peak and an intensity, which has the same mass-to-charge ratio with the maximum peak, of the mass spectrum of the sample on the display unit in a superimposed manner.

7. The apparatus of claim 1 , wherein the matching degree calculation unit calculates the matching degree by using a correlation coefficient.

8. A method of mass analysis of a sample containing a substance to be measured, the method comprising:

storing a theoretical peak obtained by calculation with respect to a region of a mass spectrum of the substance;

calculating a matching degree from multiple peaks that each of the mass spectrum of the sample in the region and the theoretical peak have, the matching degree representing degree of matching between the mass spectrum of the sample and theoretical peak;

controlling for displaying the matching degree on a display unit; and

displaying the mass spectrum of the sample and the theoretical peak on the display unit in a superimposed way in a manner that is consistent with a mass-to-charge ratio.

Assignments (3)
CHANGE OF NAME Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072905/0225 →
CHNAGE OF ADDRESS Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072909/0725 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 25, 2018
From: SAKUTA, MASAHIRO
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 046461/0672 →
Priority Claims (1)
JP JP2017-142235 · Jul 21, 2017 · national
Continuity (1)
Related Publication 20190025174A1 · Jan 24, 2019