Charged particle beam apparatus and method for controlling charged beam apparatus

1. A charged particle beam apparatus comprising:

an irradiation unit that irradiates a sample with a charged particle beam;

an image formation section that forms an image based on a signal obtained by detecting a charged particle generated from the sample due to the irradiation with the charged particle beam;

an input reception unit that receives an observation condition;

a derivation section that derives second observation parameters proper for the observation condition based on the observation condition received by the input, reception unit and first observation parameters stored in a storage unit; and

a control unit that controls the irradiation unit based on the second observation parameters.

2. The charged particle beam apparatus according to claim 1 ,

wherein the input reception unit receives, as the observation condition, a combination of a part or all of an acceleration voltage for accelerating the charged particle beam, a beam current of the charged particle beam, a lens mode that is an operation mode of an object lens for focusing the charged particle beam, a type of a holder for holding the sample, a material of the sample, and a stage position that is a position of a stage for placing the sample, and

wherein the storage unit stores the combination as the first observation parameters.

3. The charged particle beam apparatus according to claim 1 ,

wherein the storage unit stores, as the second observation parameters, a combination of a part or all of one or more beam irradiation parameters representing a beam irradiation condition related to the irradiation with the charged particle beam by the irradiation unit and one or more detection parameters representing a detection condition related to detection of the charged particle.

4. The charged particle beam apparatus according to claim 3 ,

wherein the beam irradiation parameter includes a combination of a part or all of an aligner, a beam shift, an OL value, and a stigma value which are set in the irradiation unit when the irradiation unit is allowed to irradiate the sample with the charged particle beam, and

wherein the detection condition is a combination of any one or both of a contrast value and a brightness value.

5. The charged particle beam apparatus according to claim 1 ,

wherein the storage unit stores a database in which the first observation parameters and the second observation parameters are associated with each other, and

wherein the derivation section derives the second observation parameters, which likely correspond to the observation condition among the second observation parameters included in the database, as the second observation parameters proper for the observation condition based on the received observation condition and the first observation parameters.

6. The charged particle beam apparatus according to claim 5 ,

wherein the derivation section specifies the first observation parameters closest the received observation conditions among the first observation parameters included in the database, and derives the second observation parameters, which are associated with the specified first observation parameters, as the second observation parameters likely corresponding to the observation condition.

7. The charged particle beam apparatus according to claim 6 ,

wherein a priority is associated with each of parameters included in the first observation parameters included in the database, and

wherein the derivation section specifies the first observation parameters closest the observation conditions among the observation parameters included in the database based on the priority and the received observation conditions.

8. The charged particle beam apparatus according to claim 5 ,

wherein the derivation section derives the second observation parameters, which likely correspond to the observation condition, from the database based on a machine learning algorithm allowing the database to learn and the received observation condition.

9. The charged particle beam apparatus according to claim 5 further comprising:

a database storage unit that stores the database,

wherein the derivation section reads the database from the database storage unit.

10. The charged particle beam apparatus according to claim 5 ,

wherein the derivation section acquires the database from the database storage unit via a network.

11. The charged particle beam apparatus according to claim 5 ,

wherein the database includes a database in which the first observation parameters and the second observation parameters when the irradiation unit irradiated the sample with the charged particle beam in the past are associated with each other.

12. A charged particle beam apparatus comprising:

an irradiation unit that irradiates a sample with a charged particle beam;

an input reception unit that receives an observation condition; and

a controller that operates to:

form an image based on a signal obtained detecting a charged particle generated from the sample due to the irradiation with the charged particle beam;

derive second observation parameters proper for the observation condition based on the observation condition received by the input reception unit and first observation parameters stored in a storage unit; and

control the irradiation unit based on the second observation parameters.

13. The charged particle beam apparatus according to claim 12 ,

wherein the input reception unit receives, as the observation condition, a combination of a part or all of an acceleration voltage for accelerating the charged particle beam, a beam current of the charged particle beam, a lens mode that is an operation mode of an object lens for focusing the charged particle beam, a type of a holder for holding the sample, a material of the sample, and a stage position that is a position of a stage for placing the sample, and

wherein the storage unit stores the combination as the first observation parameters.

14. The charged particle beam apparatus according to claim 12 ,

wherein the storage unit stores, as the second observation parameters, a combination of a part or all of one or more beam irradiation parameters representing a beam irradiation condition related to the irradiation with the charged particle beam by the irradiation unit and one or more detection parameters representing a detection condition related to detection of the charged particle.

15. The charged particle beam apparatus according to claim 14 ,

wherein the beam irradiation parameter includes a combination of a part or all of an aligner, a beam shift, an OL value, and a stigma value which are set in the irradiation unit when the irradiation unit is allowed to irradiate the sample with the charged particle beam, and

wherein the detection condition is a combination of any one or both of a contrast value and a brightness value.

16. The charged particle beam apparatus according to claim 12 ,

wherein the storage unit stores a database in which the first observation parameters and the second observation parameters are associated with each other, and

wherein the controller derives the second observation parameters, which likely correspond to the observation condition among the second observation parameters included in the database, as the second observation parameters proper for the observation condition based on the received observation condition and the first observation parameters.

17. The charged particle beam apparatus according to claim 16 ,

wherein the controller specifies the first observation parameters closest the received observation conditions among the first observation parameters included in the database, and derives the second observation parameters, which are associated with the specified first observation parameters, as the second observation parameters likely corresponding to the observation condition.

18. The charged particle beam apparatus according to claim 17 ,

wherein a priority is associated with each of parameters included in the first observation parameters included in the database, and

wherein the controller specifies the first observation parameters closest the observation conditions among the first observation parameters included in the database based on the priority and the received observation conditions.

19. The charged particle beam apparatus according to claim 16 ,

wherein the controller derives the second observation parameters, which likely correspond to the observation condition, from the database based on a machine learning algorithm allowing the database to learn and the received observation condition.

20. The charged particle beam apparatus according to claim 16 further comprising:

a database storage unit that stores the database,

wherein the controller reads the database from the database storage unit.

21. The charged particle beam apparatus according to claim 16 ,

wherein the controller acquires the database from the database storage unit via a network.

22. The charged particle beam apparatus according to claim 16 ,

wherein the database includes a database in which the first observation parameters and the second observation parameter when the irradiation unit irradiated the sample with the charged particle beam in the past are associated with each other.

23. A method for controlling a charged particle beam apparatus including an irradiation unit that irradiates a sample with a charged particle beam and an image formation section that forms an image based on a signal obtained by detecting a charged particle generated from the sample due to irradiation with the charged particle beam, the method comprising:

receiving an observation condition;

deriving a second observation parameter proper for the observation condition based on the received observation condition and a first observation parameter stored in a storage unit by a derivation section; and

controlling the irradiation unit by a control unit based on the derived second observation parameter.

24. The method according to claim 23 ,

wherein the storage unit includes a database in which the first observation parameter and the second observation parameter obtained when the irradiation unit irradiated the sample with the charged particle beam in the past are associated with each other.