Charged particle beam apparatus
A charged particle beam apparatus includes a charged particle beam column for irradiating a sample with a charged particle beam, and a sample stage unit for moving the sample relative to the charged particle beam column. The sample stage unit includes a rotary stage section having a base portion and a rotary mover rotatable about a rotary axis relative to the base portion. A rotary connector is disposed coaxially with and rotatable about the rotary axis and fitted between the base portion and the rotary mover for electrically connecting wirings between relatively rotating elements. A connection electrode is disposed on the sample stage unit in electrical connection with the rotary connector. In the charged particle beam apparatus, the sample is able to be rapidly placed and replaced.
1. A charged particle beam apparatus comprising:
a charged particle beam column that irradiates a sample with a charged particle beam;
a sample stage unit that moves the sample relative to the charged particle beam column, the sample stage unit including a rotary stage section having a base portion and a rotary mover rotatable about a rotary axis relative to the base portion;
a rotary connector disposed coaxially with and rotatable about the rotary axis and fitted between the base portion and the rotary mover for electrically connecting wirings between relatively rotating elements; and
a first connection electrode disposed on the sample stage unit in electrical connection with the rotary connector.
2. The charged particle beam apparatus according to claim 1 , further comprising:
a sample holder detachably disposed on the sample stage unit, the sample holder having a second connection electrode detachably connectable to the first connection electrode, a sample holding portion for holding the sample, and a holder-side moving stage section that moves the sample holding portion; and
a sample holder controller that transmits a control signal to the sample holder via the rotary connector when the second connection electrode of the sample holder is electrically connected to the first connection electrode.
3. The charged particle beam apparatus according to claim 2 , wherein the holder-side moving stage section includes a 2-axis tilting stage section rotatable about a first axis and a second axis orthogonal to the first axis.
4. The charged particle beam apparatus according to claim 3 , wherein the sample stage unit includes a holder for lock member locking a position of the sample holder with the second connection electrode of the sample holder press-connected to the first connection electrode.
5. The charged particle beam apparatus according to claim 4 , wherein a plurality of charged particle beam columns are provided.
6. The charged particle beam apparatus according to claim 3 , wherein a plurality of charged particle beam columns are provided.
7. The charged particle beam apparatus according to claim 2 , wherein the sample stage unit includes a holder lock member for locking a position of the sample holder with the second connection electrode of the sample holder press-connected to the first connection electrode.
8. The charged particle beam apparatus according to claim 7 , wherein a plurality of charged particle beam columns are provided.
9. The charged particle beam apparatus according to claim 2 , wherein a plurality of charged particle beam columns are provided.
10. The charged particle beam apparatus according to claim 1 , wherein a plurality of charged particle beam columns are provided.