IP Library Granted Patent US 11,022,570
Granted Patent B2
US 11,022,570 · App. 16/525,352 · Granted Jun 1, 2021

X-ray transmission inspection apparatus and X-ray transmission inspection method

Inventor: Yoshiki Matoba (Tokyo, JP)
Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
G01N23/18G01N23/04G01N23/044G01N23/046G01N23/06G01N23/083G01N23/087G01N2223/3306
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Quick Facts
Patent No.
US 11,022,570
App. No.
16/525,352
Granted
Jun 1, 2021
Kind
B2
Abstract

An X-ray transmission inspection apparatus includes an X-ray source for irradiating a sample with X-rays, a two-dimensional sensor for detecting transmission X-rays passing through the sample, a sample moving mechanism for moving the sample, a calculation unit for processing an image of the transmission X-rays detected by the two-dimensional sensor, and a display unit for displaying a cross-sectional image. When V 1 is a speed at which the sample moves, F is a frame rate of the two-dimensional sensor, A is a sample pitch of the two-dimensional sensor, and LS is a distance between the X-ray source and the two-dimensional sensor, the calculation unit creates a cross-sectional image taken at a distance L from the X-ray source by adding the images of the pixels positioned at an interval of [(LS×V 2 )/(L×F×A)] in a direction in which the sample moves.

Claims (35)

1. An X-ray transmission inspection apparatus comprising:

an X-ray source configured to irradiate a sample with X-rays;

a two-dimensional sensor including a detection surface installed on an opposite side of the X-ray source with the sample placed therebetween and configured to detect X-rays transmitted through the sample;

a sample moving mechanism capable of moving the sample at a predetermined speed in a predetermined direction parallel to the detection surface of the two-dimensional sensor;

a calculation unit configured to process an image of the X-rays detected by the two-dimensional sensor; and

a display unit capable of displaying a cross-sectional image based on the image of the X-rays processed by the calculation unit,

wherein the two-dimensional sensor includes a plurality of pixels that are image sensing devices arranged in a lattice pattern and is capable of reading images of the X-rays detected by the plurality of pixels at once at a predetermined frame rate, and

wherein the calculation unit creates a cross-sectional image of the sample at a position having a distance of L from the X-ray source by performing an addition process of continuously adding the images of the X-rays at an interval of [(LS×V 1 )/(L×F×A)] along the predetermined direction, where V 1 is the predetermined speed at which the sample moves, F is the predetermined frame rate, A is a pixel pitch of the two-dimensional sensor, and LS is a distance between the X-ray source and the two-dimensional sensor.

2. The X-ray transmission inspection apparatus according to claim 1 , wherein the calculation unit is configured to:

create a first cross-sectional image of the sample at a position having a distance of L 1 front the X-ray source and a second cross-sectional image of the sample at a position having a distance of L 2 from the X-ray source,

display the first cross-sectional image and the second cross-sectional image on the display unit,

perform a correction process of making a display size of the first cross-sectional image L 1 /L 2 times the first cross-sectional image, and

display the first cross-sectional image at the display size and the second cross-sectional image on the display unit.

3. The X-ray transmission inspection apparatus according to claim 2 , further comprising:

a sample rotating mechanism capable of changing an orientation of the sample with respect to the X-ray source,

wherein the calculation unit creates a plurality of cross-sectional images of the sample from the X-rays transmitted through the sample from different directions by changing directions of the sample by the sample rotating mechanism.

4. The X-ray transmission inspection apparatus according to claim 1 , further comprising:

a sample rotating mechanism capable of changing an orientation of the sample with respect to the X-ray source,

wherein the calculation unit creates a plurality of cross-sectional images of the sample from the X-rays transmitted through the sample from different directions by changing directions of the sample by the sample rotating mechanism.

5. An X-ray transmission inspection method comprising:

irradiating a sample with X-rays using an X-ray source;

detecting the X-rays transmitted through the sample using a two-dimensional sensor including a detection surface installed on an opposite side of the X-ray source with the sample placed between the X-ray source and the two-dimensional sensor;

moving the sample at a predetermined speed in a predetermined direction parallel to the detection surface of the two-dimensional sensor;

processing an image of the X-rays detected by the two-dimensional sensor by a calculation unit; and

displaying a cross-sectional image based on the image of the X-rays processed by the calculation unit on a display unit,

wherein the two-dimensional sensor includes a plurality of pixels that are image sensing devices arranged in a lattice pattern and is capable of reading images of the X-rays detected by the plurality of pixels at once at a predetermined frame rate, and

wherein the processing an image of the X-rays detected by the two-dimensional sensor comprises creating a cross-sectional image of the sample taken at a position having a distance of L from the X-ray source by performing an addition process of continuously adding the images of the X-rays at an interval of [(LS×V 1 )/(L×F×A)] in the predetermined direction, where V 1 is the predetermined speed, F is the predetermined frame rate, A is a pixel pitch of the two-dimensional sensor, and LS is a distance between the X-ray source and the two-dimensional sensor.

6. The X-ray transmission inspection method according to claim 5 , wherein the processing an image of the X-rays detected by the two-dimensional sensor comprises:

creating a first cross-sectional image of the sample at a position having a distance of L 1 from the X-ray source and a second cross-sectional image of the sample at a position having a distance of L 2 from the X-ray source on the display unit,

performing a correction process of making a display size of the first cross-sectional image of the sample L 1 /L 2 times the first cross-sectional image, and

displaying the first cross-sectional image at the display size and the second cross-sectional image on the display unit.

7. The X-ray transmission inspection method according to claim 6 , wherein the processing an image of the X-rays detected by the two-dimensional sensor comprises:

creating a plurality of cross-sectional images of the sample from the X-rays transmitted through the sample from different directions by changing an orientation of the sample with respect to the X-ray source.

8. The X-ray transmission inspection method according to claim 5 , wherein the processing an image of the X-rays detected by the two-dimensional sensor comprises:

creating a plurality of cross-sectional images of the sample from the X-rays transmitted through the sample from different directions by changing an orientation of the sample with respect to the X-ray source.

Assignments (3)
CHANGE OF NAME Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072905/0225 →
CHNAGE OF ADDRESS Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072909/0725 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 30, 2019
From: MATOBA, YOSHIKI
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 049899/0530 →
Priority Claims (1)
JP JP2018-146481 · Aug 3, 2018 · national
Continuity (1)
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Cited By (1)
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