Automatic processing device
This automatic processing device for fabricating a sample piece from a sample by irradiating the sample with a charged particle beam is provided with: a structural information acquiring unit which acquires structural information indicating the structure of the sample before processing; a processing termination position acquiring unit which acquires termination position specifying information specifying a processing termination position corresponding to the structure of the sample; an image acquiring unit which acquires a processed surface image in which a processed surface appearing at the position at which the sample has been irradiated by the charged particle beam is captured; and a determining unit which determines whether the position of the processing by the charged particle beam has reached the termination position, on the basis of a comparison between the structural information acquired by the structural information acquiring unit and the processed surface image acquired by the image acquiring unit.
1. An automatic working apparatus comprising:
a charge particle beam column configured to irradiate a sample with a charged particle beam to produce a sample piece;
an input device configured to receive an operation of an operator; and
a controller connected to the input device and, based on the input device receiving a working start instruction, the controller is configured to:
obtain structure information indicating a structure of the sample before working;
obtain end position specifying information that specifies an end position of working corresponding to the structure of the sample;
control the charged particle beam column to irradiate the sample with the charged particle beam to perform working on the sample;
obtain a working surface image, the working surface image being obtained by imaging a working surface that appears at a position where the sample is irradiated with the charged particle beam;
determine whether a working position of the charged particle beam has reached the end position specified by the end position specifying information on the basis of a comparison between the obtained working surface image and the obtained structure information; and
finish the working on the sample in response to it being determined in the determining that the working position of the charged particle beam has reached the end position.
2. The automatic working apparatus according to claim 1 ,
wherein the structure information is an image obtained by imaging the sample before working, and
wherein in determining, the controller is configured to determine whether the working position of the charged particle beam has reached the end position on the basis of a comparison between the working surface image and the image obtained by imaging the sample before working.
3. The automatic working apparatus according to claim 2 ,
wherein the structure information is an image obtained by imaging repetitive structures of the sample before working;
wherein in obtaining the working end position, the controller is configured to obtain information indicating the repetition number of repetitive structures as the end position specifying information, and
wherein in determining, the controller is configured to determine whether the working position of the charged particle beam has reached the end position on the basis of a result of comparison between the repetition number of repetitive structures found in working surface images and the repetition number of repetitive structures indicated by the image obtained by imaging the sample of the sample before working.
4. The automatic working apparatus according to claim 3 , wherein in determining, the controller is configured to determine whether the working position of the charged particle beam has reached the end position on the basis of a comparison between the repetition number of repetitive structures remaining unworked that is indicated by working surface images and the repetition number of the repetitive structures indicated by the image obtained by imaging the repetitive structures of the sample before working.
5. The automatic working apparatus according to claim 3 , wherein determining, the controller is configured to determine whether the working position of the charged particle beam has reached the end position on the basis of a comparison between the number of changes to a repetitive structure that occur sequentially in working surface images as the working proceeds and the repetition number of repetitive structures indicated by the image obtained by imaging the sample before working.
6. The automatic working apparatus according to claim 1 ,
wherein the structure information is design information of the sample before working, and
wherein in determining, the controller is configured to determine whether the working position of the charged particle beam has reached the end position on the basis of a comparison between the working surface image and the design information of the sample before working.