Sample holder, member mounting device, and charged particle beam apparatus
A sample holder, a member mounting device, and a charged particle beam apparatus are able to secure a compatible configuration for the transfer of a sample between different-type charged particle beam apparatuses without an increase in equipment costs. The charged particle beam apparatus includes a holder unit for removably fastening a sample holder for receiving a sample, and a sample stage unit for loading the holder unit in a sample chamber. The sample holder includes a sample holding member for receiving a sample, a support section for supporting the sample holding member, and a clip disposed on the support section at a position where the sample holding member is disposed.
1. A sample holder removably fastened to a holder unit of a charged particle beam apparatus, the sample holder comprising:
a sample holding member holding a sample to be irradiated with a charged particle beam;
a support section supporting the sample holding member; and
a clip to be mounted on a support region of the support section where the sample holding member is disposed, wherein
the support section has a penetration region where a through hole or a recessed groove is formed in a thickness direction at a location other than the support region,
the clip has a first grip portion and a second grip portion forming a pair between which the support section is fitted in between both sides of the thickness direction,
the first grip portion presses the sample holding member against the support region on a first surface side of the support section as well as blocks at least a portion of the through hole or the groove, and
the second grip portion is provided where the second grip portion does not interfere with the through hole or the groove on a second surface side of the support section.
2. The sample holder according to claim 1 , wherein the support region and the penetration region are provided on a first recessed portion formed on the first surface of the support section;
the first grip portion presses the sample holding member against the support region at the first recessed portion; and
the second grip portion is disposed at a second recessed portion formed on the second surface of the support section.
3. The sample holder according to claim 1 , wherein outer shape of both ends of the support section in an orthogonal direction to the thickness direction and a mounting direction of the clip is formed in a shape changing towards decreasing thickness towards a front end.
4. A member mounting device for mounting the sample holding member to the support section of the sample holder according to claim 1 , the member mounting device comprising:
a support section fastening portion fastening the support section with the clip mounted thereto;
a displacement member displacing towards the thickness direction of the support section and elastically deforming the clip to broaden a gap between the first grip portion and the second grip portion by being inserted into the hole or the recessed groove towards the first surface side from the second surface side of the support section and pressing the first grip portion in the thickness direction, and
a driver mechanism displacing the displacement member in the thickness direction.
5. A charged particle beam apparatus comprising:
a holder unit removably fastening the sample holder according to claim 1 ;
a sample chamber receiving the holder unit; and
a charged particle beam column irradiating the sample with a charged particle beam.
6. The charged particle beam apparatus according to claim 5 , wherein the holder unit includes:
a support member supporting the sample holder, and
a fastening member fastening both ends of the support section to the support member in a direction orthogonal to the thickness direction and a mounting direction of the clip.