X-ray inspection method and X-ray inspection device
Detection can be performed even for a thick inspection target object through time delay integration without degradation of spatial resolution. There is provided an X-ray inspection device configured to include: an X-ray source that generates X-rays; a transport unit that performs transporting a sample; a detecting unit that has a time delay integration type detector which detects X-rays generated by the X-ray source and transmitted through the sample transported by the transport unit; and a defect determining unit that processes a signal obtained by detecting the X-rays transmitted through the sample by the time delay integration type detector of the detecting unit and determines a defect in the sample. The transport unit performs transporting the sample while causing the sample to rotate in synchronization with the transporting when the sample passes in front of the time delay integration type detector of the detecting unit.
1. An X-ray inspection device comprising:
an X-ray source that generates X-rays;
a sample transporter comprising a linear motion conveyor and a rotating mechanism that performs transporting of a sample;
a detecting unit that has a time delay integration type detector which detects X-rays generated by the X-ray source and transmitted through the sample transported by the sample transporter; and
an image analyzer configured to process a signal obtained by detecting the X-rays transmitted through the sample by the time delay integration type detector of the detecting unit and to determiner a defect in the sample,
wherein the sample transporter is configured to transport the sample while causing the sample to rotate in synchronization with the transporting when the sample passes in front of the time delay integration type detector of the detecting unit, and
wherein the sample transporter is further configured to transport the sample at a constant linear movement velocity, v, and a constant angular velocity, ω, such that the linear movement velocity v is a constant regardless of a position, h, of an object distance from a central axis of the sample in a thickness direction.
2. The X-ray inspection device according to claim 1 , wherein the sample transporter performs transporting of the sample while causing the sample to rotate around the central axis of the sample in synchronization with the transporting.
3. The X-ray inspection device according to claim 1 , wherein the sample transporter performs transporting of the sample while causing the sample to rotate around the central axis of the sample of an inclined state in synchronization with the transporting in a state in which the sample is inclined.
4. The X-ray inspection device according to claim 1 , wherein the detecting unit has a plurality of the time delay integration type detectors, and the sample transporter performs transporting of the sample while causing the sample to rotate in synchronization with the transporting by changing an inclination angle or an azimuth angle of the sample for each of the time delay integration type detectors, when the sample transporter causes the sample to pass in front of the plurality of time delay integration type detectors of the detecting unit.
5. The X-ray inspection device according to claim 1 , wherein the sample transporter contains the sample in a container, which transmits X-rays, and performs transporting of the container.
6. The X-ray inspection device according to claim 5 , wherein the container is a medical vial, and the time delay integration type detector of the detecting unit detects X-rays transmitted through the sample after the sample contained in the container is irradiated from a side surface of the container with X-rays generated by the X-ray source.
7. An X-ray inspection method comprising:
irradiating a sample to which transporting is performed by a sample transporter with X-rays generated from an X-ray source;
transporting the sample at a constant linear movement velocity, v, and a constant angular velocity, ω, such that the linear movement velocity v is a constant regardless of a position, h, of an object distance from a central axis of the sample in a thickness direction;
detecting X-rays transmitted through the sample irradiated with the X-rays, by a time delay integration type detector; and
processing a signal obtained by detecting the X-rays transmitted through the sample by the time delay integration type detector and determining a defect in the sample,
wherein the sample is irradiated with the X-rays while the sample is caused to rotate in synchronization with the transporting when the sample passes in front of the time delay integration type detector of the detecting unit.
8. The X-ray inspection method according to claim 7 , wherein transporting of the sample is performed while the sample is caused to rotate in synchronization with the transporting with the central axis of the sample as the central axis of the rotation when the sample passes in front of the time delay integration type detector of the detecting unit.
9. The X-ray inspection method according to claim 7 , wherein transporting of the sample is performed while the sample is caused to rotate in synchronization with the transporting with the central axis of the sample of an inclined state as the central axis of the rotation in a state in which the sample is inclined when the sample passes in front of the time delay integration type detector of the detecting unit.
10. The X-ray inspection method according to claim 7 , wherein transporting of the sample is performed while the sample is caused to rotate in synchronization with the transporting by changing an inclination angle or an azimuth angle of the sample for each of time delay integration type detectors when the sample passes in front of a plurality of the time delay integration type detectors.
11. The X-ray inspection method according to claim 7 , wherein the sample transporter contains the sample in a container, which transmits X-rays, and performs the transporting of the sample.
12. The X-ray inspection method according to claim 11 , wherein the container that transmits the X-rays is a medical vial, and the detector detects X-rays transmitted through the sample by causing the time delay integration type detector to detect the X-rays transmitted through the sample after the sample contained in the container is irradiated from a side surface of the container with X-rays generated by the X-ray source.
13. An X-ray inspection method comprising:
irradiating a sample to which transporting is performed by a sample transporter with X-rays generated from an X-ray source;
detecting X-rays transmitted through the sample irradiated with the X-rays, by a time delay integration type detector; and
processing a signal obtained by detecting the X-rays transmitted through the sample by the time delay integration type detector and determining a defect in the sample,
wherein the sample is irradiated with the X-rays while the sample is caused to rotate in synchronization with the transporting when the sample passes in front of the time delay integration type detector of the detecting unit, and
wherein transporting of the sample is performed while the sample is caused to rotate around a focal position of X-rays generated from the X-ray source in synchronization with the transporting when the sample passes in front of the time delay integration type detector of the detecting unit.
14. The X-ray inspection method according to claim 13 , wherein said transporting of the sample is performed while the sample is caused to rotate around a focal position of X-rays generated from the X-ray source in synchronization with the transporting in a state in which the sample is inclined.
15. An X-ray inspection device comprising:
an X-ray source that generates X-rays;
a sample transporter comprising a linear motion conveyor and a rotating mechanism that performs transporting of a sample;
a detecting unit that has a time delay integration type detector which detects X-rays generated by the X-ray source and transmitted through the sample transported by the sample transporter; and
an image analyzer configured to process a signal obtained by detecting the X-rays transmitted through the sample by the time delay integration type detect or of the detecting unit and to determine a defect in the sample,
wherein the sample transporter is configured to transport the sample while causing the sample to rotate in synchronization with the transporting when the sample passes in front of the time delay integration type detector of the detecting unit, and
wherein the sample transporter performs transporting of the sample while causing the sample to rotate around a focal position of X-rays generated from the X-ray source in synchronization with the transporting.
16. The X-ray inspection device according to claim 15 , wherein the sample transporter performs said transporting of the sample while causing the sample to rotate around a focal position of X-rays generated from the X-ray source in synchronization with the transporting in a state in which the sample is inclined.