IP Library Assignment 044658/0981
Patent Assignment
Reel/Frame 044658/0981

Assignment of Assignor's Interest

Recorded: 2018-01-18 Pages: 6
Assignors
URANO, YUTA
Executed: 2017-11-14
ZHANG, KAIFENG
Executed: 2017-11-16
MATOBA, YOSHIKI
Executed: 2017-11-15
TAKEDA, AKIHIRO
Executed: 2017-11-16
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
X-Ray Inspection Method and X-Ray Inspection Device
Application: 15/744,223 →
Publication: US 2018/0202947
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072905/0225 →
Chnage of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072909/0725 →