Apparatus for and method of mass analysis
Disclosed is an apparatus for and a method of mass analysis, the apparatus and the method being capable of improving a detection accuracy of a target substance including impurities, without increasing a size of the apparatus, and shortening measuring time. The apparatus analyzing a sample containing a target substance and one or more interfering substances, which have a peak of a mass spectrum overlapping that of the target substance includes: a peak correction unit calculating an intensity of net peak D of the mass spectrum of the target substance by subtracting a total sum of estimated intensities of the peak B, which are calculated every predetermined time interval according to the intensity of the peak A and a nonlinear relation F between the peak A and the peak B, from an intensity of peak C of a mass spectrum of the target substance of the sample.
1. An apparatus for mass analysis, the apparatus analyzing a sample containing a target substance, which is an organic compound, and one or more interfering substances, which are organic compounds and have a peak of a mass spectrum overlapping that of the target substance, the apparatus comprising:
among peaks of a mass spectrum of a reference material of each of the interfering substances, based on a nonlinear relation F of intensities between peak A that does not overlap a peak of a mass spectrum of the target substance and peak B that overlaps the peak of the target substance,
a peak correction unit calculating an intensity of net peak D of the mass spectrum of the target substance by subtracting a total sum of estimated intensities of the peak B, which are calculated at every predetermined time interval based on the intensities of the peak A and the relation F, from an intensity of peak C of a mass spectrum of the target substance of the sample.
2. The apparatus of claim 1 , wherein two or more interfering substances are present, and
the peak correction unit subtracts a total sum of the estimated intensities of each of the interfering substances from the intensity of the peak C.
3. The apparatus of claim 1 , wherein the peak correction unit calculates the intensity of the peak D when the estimated intensity exceeds a predetermined threshold value.
4. The apparatus of claim 1 , further comprising:
an ion source ionizing the target substance and the interfering substance,
wherein the peak B is resulted from fragment ions generated from the interfering substance during the ionization.
5. The apparatus of claim 1 , further comprising:
a display controller displaying the estimated intensity and the intensity of the peak B on a predetermined display unit for each time in a superimposed manner.
6. The apparatus of claim 1 , further comprising:
a display controller displaying the estimated intensity and the intensity of the peak C on a predetermined display unit for each time in a superimposed manner.
7. A method of mass analysis, the method analyzing a sample containing a target substance, which is an organic compound, and one or more interfering substances, which are an organic compound and have a peak of a mass spectrum overlapping that of the target substance, the method comprising:
among peaks of a mass spectrum of a reference material of each of the interfering substances, based on a nonlinear relation F of intensities between peak A that does not overlap a peak of a mass spectrum of the target substance and peak B that overlaps the peak of the target substance,
subtracting a total sum of estimated intensities of the peak B, which are calculated at every predetermined time interval according to the intensities of the peak A and the relation F, from an intensity of peak C of a mass spectrum of the target substance of the sample to calculate an intensity of net peak D of the mass spectrum of the target substance.