Cross section processing observation method and charged particle beam apparatus
Provided is a cross-section processing observation method capable of easily and accurately forming a cross-section used to observe a sample's inside, and a cross-section processing observation apparatus for cross-section processing. The method includes a design data acquisition step acquiring design data of a three-dimensional structure of a sample having three-dimensional structure, a moving step moving the sample based on coordinate information of the design data, a surface observation step acquiring an observation image of a surface of the sample, a cross-section forming step irradiating the sample's surface with an ion beam to form a cross-section of the three-dimensional structure, a cross-section observation step acquiring an observation image of the sample's cross-section, and a display step displaying image data, among pieces of the design data, of surface and cross section corresponding to respective locations of the surface and the cross section.
1. A cross section processing observation method comprising:
a design data acquisition step of acquiring design data of a three-dimensional structure of a sample having the three-dimensional structure;
a moving step of moving the sample based on coordinate information of the design data;
a surface observation step of acquiring an observation image of a surface of the sample;
a cross section forming step of irradiating the surface of the sample with an ion beam to form a cross section of the three-dimensional structure;
a cross section observation step of acquiring an observation image of the cross section; and
a display step of displaying, among pieces of the design data, image data of a surface and a cross section corresponding to locations of the surface and the cross section, respectively.
2. The cross section processing observation method according to claim 1 , further comprising:
a new cross section forming step of forming a new cross section by performing a slicing process on the cross section at a predetermined slicing thickness; and
an updating step of updating, among the pieces of the design data, image data of a cross section corresponding to a location of the new cross section.
3. The cross section processing observation method according to claim 1 , further comprising:
a positioning step of determining a location of sampling for the sample based on the design data; and
a comparison step in the cross section forming step of comparing an observation image of the cross section of the sample with the image data, among the pieces of the design data, of a cross section at a location corresponding to the observation image of the cross section.
4. The cross section processing observation method according to claim 2 , further comprising:
a location-determining step of determining a location of sampling for the sample based on the design data; and
a comparison step in the cross section forming step of comparing an observation image of the cross section of the sample with the image data, among the pieces of the design data, of a cross section at a location corresponding to the observation image of the cross section.
5. A charged particle beam apparatus comprising:
a charged particle beam column configured to irradiate a sample having a three-dimensional structure with a charged particle beam;
a storage unit configured to store design data of the three-dimensional structure;
a secondary particle detector configured to detect secondary particles released from a surface and a cross section of the sample by irradiation with the charged particle beam;
an image forming unit configured to form, based on a detection signal output from the secondary particle detector, an observation image of the surface of the sample and an observation image of the cross section of the sample; and
a display control device configured to display, among pieces of the design data, image data of a surface and a cross section corresponding to respective locations of the surface and the cross section of the sample.
6. The charged particle beam apparatus according to claim 5 , further comprising an updating unit configured to update, among the pieces of the design data, image data of a cross section corresponding to a location of a newly exposed cross section resulting from the slicing process, in association with a slicing process of the sample by irradiation with the charged particle beam.
7. The charged particle beam apparatus according to claim 5 , further comprising a comparator configured to compare an observation image of the sample with the image data, among the pieces of the design data, of a cross section corresponding to the location of the cross section.
8. The charged particle beam apparatus according to claim 6 , further comprising a comparator configured to compare an observation image of the sample with the image data, among the pieces of the design data, of a cross section corresponding to the location of the cross section.
9. The cross section processing observation method according to claim 1 , wherein the image data of a surface and a cross section corresponding to locations of the surface and the cross section is displayed together with the acquired observation image of the cross section in the display step.
10. The charged particle beam apparatus according to claim 5 , wherein the display control device is configured to display the image data of a surface and a cross section corresponding to respective locations of the surface and the cross section of the sample together with the observation image of the cross section of the sample formed by the image forming unit.