Charged particle beam apparatus, and method and program for limiting stage driving range thereof

1. A charged particle beam apparatus, comprising:

a stage supporting a sample holder on which a sample is placed;

a stage driving mechanism driving the stage:

a sample chamber in which the stage is accommodated;

a focused ion beam column irradiating the sample with a focused ion beam;

an electron beam column irradiating the sample with an electron beam;

a detector detecting secondary ions or secondary electrons generated from the sample by irradiation with the focused ion beam or the electron beam;

a reading unit reading identification information attached to the sample holder;

a memory unit storing holder shape information indicating correspondence between the identification information and a shape of the sample holder, and design information that is shape information of an internal structure of the sample chamber; and

a stage driving range limiting unit limiting a driving range of the stage supporting the sample holder, based on the shape of the sample holder which is acquired from the identification information read by the reading unit and the holder shape information and based on a shape of the internal structure.

2. The charged particle beam apparatus of claim 1 , further comprising:

an auxiliary sample chamber in which the reading unit is disposed;

a transfer unit transferring the sample holder from the auxiliary sample chamber into the sample chamber; and

a transfer control device controlling transfer of the sample holder by the transfer unit, based on a result of reading the identification information by the reading unit, wherein

the reading unit reads the identification information attached to the sample holder located in the auxiliary sample chamber.

3. The charged particle beam apparatus of claim 2 , wherein the transfer unit does not transfer the sample holder located in the auxiliary sample chamber into the sample chamber when the reading unit does not successfully read the identification information attached to the sample holder located in the auxiliary sample chamber.

4. The charged particle beam apparatus of claim 1 , wherein the stage driving range limiting unit limits the driving range of the stage to a range in which all of the sample, the sample holder, the stage, and the stage driving mechanism do not interfere with the internal structure.

5. The charged particle beam apparatus of claim 1 , further comprising:

an operator information acquiring unit acquiring operator information for identifying an operator of the charged particle beam apparatus; and

a history managing unit matching the operator information acquired by the operator information acquiring unit and the identification information read by the reading unit and storing a matching result in the memory unit.

6. The charged particle beam apparatus of claim 5 , further comprising:

an operator work efficiency calculating unit calculating work efficiency of each operator of the charged particle beam apparatus, based on history information.

7. A method of limiting a stage driving range of a charged particle beam apparatus, which includes a stage supporting a sample holder on which a sample is placed, a stage driving mechanism driving the stage, a sample chamber in which the stage is accommodated, a focused ion beam column irradiating the sample with a focused ion beam, an electron beam column irradiating the sample with an electron beam, and a detector detecting secondary ions or secondary electrons generated from the sample by irradiation with the focused ion beam or the electron beam, the method comprising:

reading identification information attached to the sample holder;

storing holder shape information indicating correspondence between the identification information and a shape of the sample holder, and design information that is shape information of an internal structure of the sample chamber; and

limiting a driving range of the stage supporting the sample holder, based on the identification information read in the step of reading of the identification information, the shape of the sample holder acquired from the holder shape information, and a shape of the internal structure.

8. A program executed in a computer of a charged particle beam apparatus that includes a stage supporting a sample holder on which a sample is placed, a stage driving mechanism driving the stage, a sample chamber in which the stage is accommodated, a focused ion beam column irradiating the sample with a focused ion beam, an electron beam column irradiating the sample with an electron beam, and a detector detecting secondary ions or secondary electrons generated from the sample by irradiation with the focused ion beam or the electron beam, and comprising:

reading identification information attached to the sample holder;

storing holder shape information indicating correspondence between the identification information and a shape of the sample holder, and design information that is shape information of an internal structure of the sample chamber; and

limiting a driving range of the stage supporting the sample holder, based on the identification information read in the step of reading the identification information, the shape of the sample holder acquired from the holder shape information, and a shape of the internal structure.