IP Library Granted Patent US 10,969,319
Granted Patent B2
US 10,969,319 · App. 16/041,623 · Granted Apr 6, 2021

Apparatus for and method of mass analysis

Inventors: Ryusuke Hirose (Tokyo, JP); Hideyuki Akiyama (Tokyo, JP); Noriaki Sakai (Tokyo, JP)
Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
G01N5/04G01N25/20
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Quick Facts
Patent No.
US 10,969,319
App. No.
16/041,623
Granted
Apr 6, 2021
Kind
B2
Abstract

The apparatus for mass analysis includes: a heating unit heating a sample containing a first substance and a second substance having different gasification temperatures to evolve gas components; a heating control unit controlling the heating unit to heat the sample at a first temperature point at which gas of the first substance is evolved and gas of the second substance is not evolved, until reaching a first time point, whereafter the heating unit is controlled to heat the sample until reaching a second temperature point at which gas of the second substance is evolved; and an analysis control unit performing mass analysis under a first measurement condition assigned to the first substance until reaching the first time point at the first temperature point, and performing mass analysis under a second measurement condition assigned to the second substance at the second temperature point.

Claims (9)

1. An apparatus for mass analysis, the apparatus comprising:

a heating unit heating a sample containing a first substance and a second substance, which gasifies at a higher temperature compared to the first substance, to evolve gas components which are detected by the apparatus for mass analysis;

a heating control unit controlling the heating unit to heat the sample at a first temperature point at which gas of the first substance is evolved and gas of the second substance is not evolved, until reaching a first time point, and when the first time point is past, controlling the heating unit to heat the sample until a second temperature point which is higher than the first temperature point and at which gas of the second substance is evolved, is reached, the first temperature point and the first time point being obtained beforehand; and

an analysis control unit performing mass analysis under a first measurement condition assigned to the first substance until reaching the first time point at the first temperature point, and performing mass analysis under a second measurement condition assigned to the second substance at the second temperature point.

2. The apparatus of claim 1 , wherein, when the analysis control unit performs mass analysis of the first substance under the first measurement condition, the first time point is determined to be a point at which a peak intensity of the first substance is equal or less than a predetermined threshold value.

3. The apparatus of claim 1 , wherein the first substance is phthalate ester and the second substance is bromide.

4. A method of mass analysis using an apparatus provided with a heating unit heating a sample containing a first substance and a second substance which gasifies at a higher temperature compared to the first substance to evolve gas components which are detected by the apparatus for mass analysis, the method comprising:

a heating control process in which the heating unit is controlled to heat the sample at a first temperature point at which gas of the first substance is evolved and gas of the second substance is not evolved, until reaching a first time point, and when the first time point is past, the heating unit is controlled to heat the sample until reaching a second temperature point which is higher than the first temperature point and at which gas of the second substance is evolved, is reached, the first temperature point and the first time point being obtained beforehand; and

an analysis control process in which mass analysis is performed under a first measurement condition assigned to the first substance until reaching the first time point at the first temperature point, and mass analysis is performed under a second measurement condition assigned to the second substance at the second temperature point.

Assignments (3)
CHANGE OF NAME Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072905/0225 →
CHNAGE OF ADDRESS Recorded Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072909/0725 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 25, 2018
From: HIROSE, RYUSUKE; AKIYAMA, HIDEYUKI; SAKAI, NORIAKI
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 046461/0687 →
Priority Claims (1)
JP 2017-142236 · Jul 21, 2017 · national
Continuity (1)
Related Publication 20190025173A1 · Jan 24, 2019