IP Library › Assignment 045879/0763
Patent Assignment
Reel/Frame 045879/0763

Assignment of Assignor's Interest

Recorded: 2018-05-23 Pages: 5
Assignor
OMNIPROBE, INC.
Executed: 2018-03-28
Assignee
OXFORD INSTRUMENTS AMERICA, INC.
300 BAKER AVE., SUITE 150, CONCORD, MASSACHUSETTS, 01742
Covered Properties (29)
Method for Sample Separation and Lift-Out with One Cut
Patent: 6,420,722 →
Application: 09/863,571 →
Publication: US 2001/0045511
Transmission Electron Microscope Sample Preparation
Patent: 6,841,788 →
Application: 09/920,715 →
Total Release Method for Sample Extraction from a Charged-Particle Instrument
Patent: 6,570,170 →
Application: 10/085,968 →
Publication: US 2002/0121614
Method for Manipulating Microscopic Particles and Analyzing
Patent: 6,777,674 →
Application: 10/252,659 →
Publication: US 2004/0056194
Sample Manipulation System
Patent: 6,927,400 →
Application: 10/801,477 →
Publication: US 2004/0178355
End Effector for Supporting a Microsample
Patent: 6,995,380 →
Application: 10/801,521 →
Publication: US 2004/0178372
Transmission Electron Microscope Sample Preparation
Patent: 6,982,429 →
Application: 10/886,201 →
Publication: US 2004/0245466
Strain Detection for Automated Nano-Manipulation
Patent: 7,395,727 →
Application: 11/186,072 →
Publication: US 2007/0089528
Method and Apparatus for in-Situ Probe Tip Replacement Inside a Charged Particle Beam Microscope
Patent: 7,381,971 →
Application: 11/186,073 →
Publication: US 2006/0022135
Method and Apparatus for the Automated Process of in-Situ Lift-Out
Patent: 7,414,252 →
Application: 11/265,934 →
Publication: US 2006/0091325
Apparatus and Method of Detecting Probe Tip Contact with a Surface
Patent: 7,208,724 →
Application: 11/266,678 →
Publication: US 2006/0091302
Method of Preparing a Sample for Examination in a Tem
Patent: 7,315,023 →
Application: 11/334,929 →
Publication: US 2006/0113476
Method and Apparatus for Transfer of Samples in a Controlled Environment
Patent: 7,644,637 →
Application: 11/860,663 →
Publication: US 2009/0078060
Method for Stem Sample Inspection in a Charged Particle Beam Instrument
Patent: 7,834,315 →
Application: 12/041,217 →
Publication: US 2008/0258056
Method for Preparing Specimens for Atom Probe Analysis and Specimen Assemblies Made Thereby
Patent: 8,288,740 →
Application: 12/163,290 →
Publication: US 2009/0320624
Single-Channel Optical Processing System for Energetic-Beam Microscopes
Patent: 7,961,397 →
Application: 12/201,447 →
Publication: US 2010/0051802
Method of Forming Tem Sample Holder
Patent: 7,935,937 →
Application: 12/391,552 →
Publication: US 2009/0294690
Method and Apparatus for Precursor Delivery System for Irradiation Beam Instruments
Patent: 8,394,454 →
Application: 12/399,579 →
Publication: US 2009/0223451
Multiple Magnification Optical System with Single Objective Lens
Patent: 8,054,558 →
Application: 12/701,071 →
Publication: US 2010/0202042
Variable-Tilt Specimen Holder and Method and for Monitoring Milling in a Charged-Particle Instrument
Patent: 8,227,781 →
Application: 12/842,105 →
Publication: US 2011/0017927
Method for Stem Sample Inspection in a Charged Particle Beam Instrument
Patent: 8,168,949 →
Application: 12/896,274 →
Publication: US 2011/0031396
Method for Stem Sample Inspection in a Charged Particle Beam Instrument
Patent: 8,247,768 →
Application: 12/896,281 →
Publication: US 2011/0031397
Method and Apparatus for Acquiring Simultaneous and Overlapping Optical and Charged Particle Beam Images
Patent: 8,440,969 →
Application: 13/196,240 →
Publication: US 2012/0025075
Apparatus for Precursor Delivery System for Irradiation Beam Instruments
Patent: 8,512,474 →
Application: 13/357,741 →
Publication: US 2013/0025536
Method for Extracting Frozen Specimens and Manufacture of Specimen Assemblies
Patent: 8,513,622 →
Application: 13/439,346 →
Publication: US 2013/0091875
Method for Processing Samples Held by a Nanomanipulator
Patent: 8,759,765 →
Application: 13/567,487 →
Publication: US 2013/0037713
Gas Injection System for Energetic-Beam Instruments
Patent: 9,097,625 →
Application: 13/864,362 →
Publication: US 2014/0014742
Total Release Method for Sample Extraction in an Energetic-Beam Instrument
Patent: 9,349,573 →
Application: 14/797,087 →
Publication: US 2016/0035540
Rapid Tem Sample Preparation Method with Backside Fib Milling
Application: 14/926,648 →
Publication: US 2016/0189929
Related Assignments (20)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Aug 3, 2001
From: ROBINSON, JOSEPH; CHURCH, KENNETH H.
To: ASCEND INSTRUMENTS, INC.; SCIPERIO, INC.
Reel/Frame 012046/0748 →
Assignment of Assignor's Interest Dec 30, 2002
From: ANTHONY, JOHN M.
To: OMNIPROBE, INC.
Reel/Frame 013618/0186 →
Assignment of Assignor's Interest Dec 30, 2002
From: MOORE, THOMAS M.
To: OMINIPROBE, INC.
Reel/Frame 013615/0876 →
Assignment of Assignor's Interest Apr 14, 2003
From: MOORE, THOMAS M.
To: OMNIPROBE, INC.
Reel/Frame 013953/0843 →
Assignment of Assignor's Interest Apr 14, 2003
From: MOORE, THOMAS M.; KRUGER, ROCKY D.; HARTFIELD, CHERYL
To: OMNIPROBE, INC.
Reel/Frame 013949/0824 →
Assignment of Assignor's Interest Mar 12, 2004
From: RASMUSSEN, JORGEN
To: ASCEND INSTRUMENTS, LLC
Reel/Frame 015101/0905 →
Assignment of Assignor's Interest Mar 12, 2004
From: RASMUSSEN, JORGEN
To: ASCEND INSTRUMENTS, LLC
Reel/Frame 015110/0454 →
Assignment of Assignor's Interest May 15, 2006
From: MOORE, THOAMS M.; ZAYKOVA-FELDMAN, LYUDMILA
To: OMNIPROBE, INC.
Reel/Frame 017887/0813 →
Assignment of Assignor's Interest May 15, 2006
From: MOORE, THOMAS M.; ZAYKOVA-FELDMAN, LYUDMILA
To: OMNIPROBE, INC.
Reel/Frame 017864/0859 →
Assignment of Assignor's Interest Oct 6, 2006
From: MOORE, THOMAS M.
To: OMNIPROBE, INC.
Reel/Frame 018374/0410 →
Assignment of Assignor's Interest Jan 16, 2007
From: MOORE, THOMAS M.; ZAYKOVA-FELDMAN, LYUDMILA
To: OMNIPROBE, INC.
Reel/Frame 018769/0133 →
Assignment of Assignor's Interest Jul 30, 2007
From: ASCEND INSTRUMENTS, INC. F/K/A ASCEND INSTRUMENTS, LLC
To: OMNIPROBE, INC.
Reel/Frame 019658/0522 →
Plan of Conversion Jul 30, 2007
From: ASCEND INSTRUMENTS, LLC
To: ASCEND INSTRUMENTS, INC.
Reel/Frame 019658/0516 →
Assignment of Assignor's Interest Jul 30, 2007
From: ASCEND INSTRUMENTS, INC.; SCIPERIO, INC.
To: OMNIPROBE, INC.
Reel/Frame 019658/0511 →
Assignment of Assignor's Interest Jul 30, 2007
From: ROBINSON, JOSEPH; CHURCH, KENNETH R.
To: OMNIPROBE, INC.
Reel/Frame 019649/0352 →
Assignment of Assignor's Interest Mar 25, 2008
From: ZAYKOVA-FELDMAN, LYUDMILA; MOORE, THOMAS M.; AMADOR, GONZALO; HAMMER, MATTHEW
To: OMNIPROBE, INC.
Reel/Frame 020695/0431 →
Assignment of Assignor's Interest Jul 30, 2008
From: HARTFIELD, CHERYL
To: OMNIPROBE, INC.
Reel/Frame 021314/0788 →
Assignment of Assignor's Interest Jul 30, 2008
From: AMADOR, GONZALO
To: OMNIPROBE, INC.
Reel/Frame 021314/0774 →
Assignment of Assignor's Interest Aug 15, 2008
From: GORMAN, BRIAN P.; DIERCKS, DAVID R.
To: UNIVERSITY OF NORTH TEXAS
Reel/Frame 021395/0201 →
Assignment of Assignor's Interest Aug 29, 2008
From: MARCHMAN, HERSCHEL M.; MOORE, THOMAS M.; KRUGER, ROCKY
To: OMNIPROBE, INC.
Reel/Frame 021463/0620 →