IP Library › Assignment 046405/0078
Patent Assignment
Reel/Frame 046405/0078

Assignment of Assignor's Interest

Recorded: 2018-07-19 Pages: 7
Assignor
Assignee
AMERICAN PATENTS LLC
2325 OAK ALLEY, TYLER, TEXAS, 75703
Covered Properties (6)
Variable Clocked Scan Test Circuitry and Method
Patent: 7,234,092 →
Application: 10/351,276 →
Publication: US 2003/0229834
Power Control Method and Telecommunications System
Patent: 7,174,181 →
Application: 10/400,674 →
Publication: US 2004/0002353
Accelerated Scan Circuitry and Method for Reducing Scan Test Data Volume and Execution Time
Patent: 7,197,681 →
Application: 10/750,949 →
Publication: US 2004/0148554
Accelerated Scan Circuitry and Method for Reducing Scan Test Data Volume and Execution Time
Patent: 7,188,286 →
Application: 10/931,079 →
Publication: US 2005/0028060
On-Chip Service Processor
Application: 60/079,316 →
Variable clocked scan test method
Application: 60/387,683 →
Related Assignments (7)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest May 9, 2003
From: COOKE, LAURENCE H.
To: ON-CHIP TECHNOLOGIES, INC.
Reel/Frame 014056/0571 →
Assignment of Assignor's Interest Aug 19, 2003
From: FRANTTI, TAPIO
To: VALTION TEKNILLINEN TUTKIMUSKESKUS
Reel/Frame 013888/0980 →
Assignment of Assignor's Interest Jan 5, 2004
From: DERVISOGLU, BULENT; COOKE, LAURENCE H.
To: ON-CHIP TECHNOLOGIES, INC.
Reel/Frame 014872/0001 →
Assignment of Assignor's Interest Jan 17, 2008
From: VALTION TEKNILLINEN TUTKIMUSKESKUS
To: AUCTNYC 15 LLC
Reel/Frame 020376/0913 →
Assignment of Assignor's Interest Apr 4, 2008
From: ON-CHIP TECHNOLOGIES, INC.
To: OC APPLICATIONS RESEARCH LLC
Reel/Frame 020753/0337 →
Merger Dec 7, 2010
From: OC APPLICATIONS RESEARCH LLC
To: INTELLECTUAL VENTURES I LLC
Reel/Frame 025467/0063 →
Merger Dec 30, 2010
From: OC APPLICATIONS RESEARCH LLC
To: INTELLECTUAL VENTURES I LLC
Reel/Frame 025564/0101 →