Patent Assignment
Reel/Frame 046819/0193
Assignment of Assignor's Interest
Recorded: 2018-09-07
Pages: 3
Assignors
URANO, YUTA
Executed: 2018-06-20
SHIBATA, YUKIHIRO
Executed: 2018-07-06
HONDA, TOSHIFUMI
Executed: 2018-06-18
YOSHITAKE, YASUHIRO
Executed: 2018-07-27
FUKUSHIMA, HIDEKI
Executed: 2018-07-06
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-8717, JAPAN
Covered Property
(1)
Defect Inspection Device, Pattern Chip, and Defect Inspection Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.