Patent Assignment
Reel/Frame 046855/0412
Assignment of Assignor's Interest
Recorded: 2018-09-12
Pages: 2
Assignors
HASEGAWA, MASAKI
Executed: 2018-08-27
ONUKI, KATSUNORI
Executed: 2018-08-27
KANEOKA, NORIYUKI
Executed: 2018-08-27
MURAKOSHI, HISAYA
Executed: 2018-08-27
OGATA, TOMOHIKO
Executed: 2018-08-27
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Defect Inspection Method and Defect Inspection Device
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.