Patent Assignment
Reel/Frame 047485/0013
Assignment of Assignor's Interest
Recorded: 2018-11-13
Pages: 5
Assignors
URANO, TAKAHIRO
Executed: 2018-10-11
HONDA, TOSHIFUMI
Executed: 2018-10-18
HIROI, TAKASHI
Executed: 2018-10-15
HIROSE, NOBUAKI
Executed: 2018-10-11
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-8717, JAPAN
Covered Property
(1)
Inspection Information Generation Device, Inspection Information Generation Method, and Defect Inspection Device
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.