Patent Assignment
Reel/Frame 047582/0806
Assignment of Assignor's Interest
Recorded: 2018-11-26
Pages: 2
Assignors
HIRAI, TAKEHIRO
Executed: 2018-11-12
NAKAYAMA, HIDEKI
Executed: 2018-11-08
NISHIGATA, KENICHI
Executed: 2018-11-09
Assignee
HITACHI HIGH-TECHNOLOGIES COPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Defect Observation Device and Defect Observation Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.