Patent Assignment
Reel/Frame 048107/0964
Assignment of Assignor's Interest
Recorded: 2019-01-23
Pages: 4
Assignee
JEOL LTD.
3-1-2 MUSASHINO, AKISHIMA, TOKYO, 196-8558, JAPAN
Covered Property
(1)
Scanning Electron Microscope and Measurement Method for Obtaining Images of a Specimen Using an Ion Beam and an Electron Beam