Patent Assignment
Reel/Frame 048623/0220
Assignment of Assignor's Interest
Recorded: 2019-03-18
Pages: 5
Assignors
TAKAGI, YUJI
Executed: 2019-02-12
FUKUNAGA, FUMIHIKO
Executed: 2019-02-13
GOTO, YASUNORI
Executed: 2019-03-15
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-8717, JAPAN
Covered Property
(1)
Electron Microscope Device and Inclined Hole Measurement Method Using Same
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.