Patent Assignment
Reel/Frame 052662/0726
Change of Name
Recorded: 2020-05-14
Pages: 10
Assignor
HITACHI HIGH-TECHNOLOGIES CORPORATION
Executed: 2020-02-12
Assignee
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Properties
(31)
Analysis Device and Analysis Method
Temperature Regulating Container
Application:
15/326,201 →
Publication:
US 2017/0211032
Test Device
Charged Particle Beam Device and Control Method of Charged Particle Beam Device
Vacuum Apparatus
Charged Particle Beam Apparatus and Control Method Thereof
Ion Milling Device
Charged Particle Detector Including a Light-Emitting Section Having Lamination Structure, Charged Particle Beam Device, and Mass Spectrometer.
Base Sequence Determination Apparatus, Capillary Array Electrophoresis Apparatus, and Method
Defect Classification Apparatus and Defect Classification Method
Measurement and Inspection Device
Defect Observation Device
Wafer Observation Device
Ion Milling Apparatus
Electrolyte Concentration Measurement Device
Sample for Measuring Particles, Method for Measuring Particles and Apparatus for Measuring Particles
Charged Particle Beam Device and Aberration Correction Method for Charged Particle Beam Device
Measuring Device and Measuring Method
Electron Source and Electron Beam Irradiation Device
Application:
16/328,150 →
Publication:
US 2019/0198284
Defect Inspection Device and Defect Inspection Method
Image Analysis Apparatus and Charged Particle Beam Apparatus
Electron Microscope Device and Inclined Hole Measurement Method Using Same
Charged Particle Beam Device
Diagnostic Imaging Assistance Apparatus and System, and Diagnostic Imaging Assistance Method
Automated Analysis Device
Current Measurement Device and Current Measurement Method Using Nanopore
Pattern Inspection System
Charged Particle Beam Apparatus, Observation Method Using Charged Particle Beam Apparatus, and Program
Image Diagnosis Assisting Apparatus, Image Diagnosis Assisting System and Image Diagnosis Assisting Method
Defect Inspection Apparatus and Defect Inspection Method
Charged Particle Beam Device and Image Processing Method in Charged Particle Beam Device
Related Assignments
(18)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Dec 20, 2016
From: NOGAMI, MAKOTO; ITO, SHINYA; YABUHARA, TADAO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 040688/0127 →
Assignment of Assignor's Interest
Jan 13, 2017
From: MASUYA, AKIRA; MAESHIMA, MUNEO; SHOJI, YASUNORI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 040969/0293 →
Assignment of Assignor's Interest
Jul 18, 2017
From: UEMATSU, CHIHIRO; MAESHIMA, MUNEO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 043032/0417 →
Assignment of Assignor's Interest
Dec 7, 2017
From: KOBAYASHI, HIROSHI; KARAKAMA, AKIRA; SATO, NORIO
To: HITACHI HIGH-TECHNOLOGIES CORPOARATION
Reel/Frame 044333/0593 →
Assignment of Assignor's Interest
May 3, 2018
From: KATAGIRI, SOUICHI; KASUYA, KEIGO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 045705/0038 →
Assignment of Assignor's Interest
May 18, 2018
From: SUNAOSHI, TAKESHI; ORAI, YOSHIHISA; HATANO, HARUHIKO; MIZUO, TAKASHI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 045845/0378 →
Assignment of Assignor's Interest
Jun 19, 2018
From: IWAYA, TORU; MUTO, HIROBUMI; TAKASU, HISAYUKI; KAMINO, ATSUSHI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 046133/0116 →
Assignment of Assignor's Interest
Jul 18, 2018
From: IMAMURA, SHIN; OHSHIMA, TAKASHI; TSUCHIYA, TOMONOBU; KAWANO, HAJIME
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 046378/0350 →
Assignment of Assignor's Interest
Jul 23, 2018
From: KAWAGUCHI, YOHEI; YASUDA, TOMOHIRO; CHALKIDIS, GEORGE; YOKOI, TAKAHIDE
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 046432/0287 →
Assignment of Assignor's Interest
Oct 4, 2018
From: KONDO, NAOAKI; HIRAI, TAKEHIRO; HARADA, MINORU; TAKAGI, YUJI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 047063/0029 →
Assignment of Assignor's Interest
Jan 9, 2019
From: ASAI, KENGO; SHICHI, HIROYASU; IWAYA, TORU; TAKASU, HISAYUKI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 047944/0651 →
Assignment of Assignor's Interest
Jan 23, 2019
From: KISHIOKA, ATSUSHI; ONO, TETSUYOSHI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 048111/0957 →
Assignment of Assignor's Interest
Jan 30, 2019
From: OTANI, YUKO; MINEKAWA, YOHEI; NOBUHARA, TAKASHI; KANZAKI, NOBUHIKO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 048183/0842 →
Assignment of Assignor's Interest
Jan 30, 2019
From: LI, WEN; MURAKAMI, SHINICHI; TAKAHASHI, HIROYUKI; SASAKI, YUKO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 048187/0337 →
Assignment of Assignor's Interest
Feb 1, 2019
From: KONDO, NAOAKI; HARADA, MINORU; TAKAGI, YUJI; HIRAI, TAKEHIRO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 048218/0403 →
Assignment of Assignor's Interest
Feb 15, 2019
From: URANO, KOTOKO; CHENG, ZHAOHUI; OHASHI, TAKEYOSHI; KAZUMI, HIDEYUKI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 048342/0046 →
Assignment of Assignor's Interest
Mar 13, 2019
From: HASHIZUME, TOMIHIRO; YASUTAKE, MASATOSHI; NAGATA, SANATO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 048580/0423 →
Assignment of Assignor's Interest
Aug 30, 2019
From: DOU, SHUYANG; SHINODA, SHINICHI; TOYODA, YASUTAKA; SHINDO, HIROYUKI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 050224/0571 →