IP Library Granted Patent US 10,784,074
Granted Patent B2
US 10,784,074 · App. 15/777,121 · Granted Sep 22, 2020

Charged particle beam apparatus and control method thereof

Inventors: Takeshi Sunaoshi (Tokyo, JP); Yoshihisa Orai (Tokyo, JP); Haruhiko Hatano (Tokyo, JP); Takashi Mizuo (Tokyo, JP)
Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
H01J37/20F25B19/005H01J37/28H01J2237/002H01J2237/028H01J2237/2001H01J2237/262H01J2237/28
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Quick Facts
Patent No.
US 10,784,074
App. No.
15/777,121
Granted
Sep 22, 2020
Kind
B2
Abstract

The invention is directed to a charged particle beam apparatus that enables temperature maintenance in a cooling unit provided inside a vacuum application apparatus using a refrigerant. The charged particle beam apparatus includes a cooling tank that contains a refrigerant for cooling a cooling unit, a cooling pipe that supplies the refrigerant from the cooling tank to the cooling unit, and a unit that leads the refrigerant to liquefy when the refrigerant is biased to a solid.

Claims (40)

1. A charged particle beam apparatus for cooling a cooling unit inside a vacuum application apparatus, comprising:

a cooling tank that contains a refrigerant for cooling the cooling unit;

a cooling pipe that supplies the refrigerant from the cooling tank to the cooling unit;

a unit, comprising:

a pump configured to exhaust the interior of the cooling tank to depressurize the interior of the cooling tank;

a valve configured to inject gas into the interior of the cooling tank to pressurize the interior of the cooling tank; and

a vacuum gauge configured to measure a degree of vacuum of the interior of the cooling tank; and

a controller configured to:

control the refrigerant to liquefy when the refrigerant is biased to a solid;

control the pump and the valve to maintain the refrigerant in a solid-liquid coexisting state by pressurizing and depressurizing an interior of the cooling tank based on the degree of vacuum measured by the vacuum gauge; and

control operation of at least one of the pump and the valve when the degree of vacuum measured by the vacuum gauge is a predetermined degree of vacuum.

2. The charged particle beam apparatus according to claim 1 , wherein

the controller is configured to control the refrigerant to liquefy by pressurizing the interior of the cooling tank.

3. The charged particle beam apparatus according to claim 1 , wherein

the controller is configured to control the refrigerant to liquefy by heating the refrigerant.

4. The charged particle beam apparatus according to claim 1 , wherein

the controller is configured to control the refrigerant to liquefy by vibrating the refrigerant.

5. The charged particle beam apparatus according to claim 1 , wherein

the controller is configured to control the refrigerant to liquefy by heating the refrigerant when the refrigerant is biased to a solid, and control the refrigerant to solidify by depressurizing the interior of the cooling tank when the refrigerant is biased to a liquid.

6. The charged particle beam apparatus according to claim 1 , wherein

the controller is configured to control the refrigerant to liquefy by vibrating the refrigerant when the refrigerant is biased to a solid, and leads the refrigerant to solidify by depressurizing the cooling tank when the refrigerant is biased to a liquid.

7. The charged particle beam apparatus according to claim 5 , wherein

the unit includes a heater that heats the refrigerant.

8. The charged particle beam apparatus according to claim 6 , wherein

the unit includes a vibration generator that vibrates the refrigerant.

9. The charged particle beam apparatus according to claim 1 , wherein

the unit further includes a thermocouple that measures a temperature of the interior of the cooling tank and the controller is configured to control at least one of the pump and the valve based on the temperature measured by the thermocouple, and

the controller controls the pump and the valve when the temperature measured by the thermocouple is a predetermined temperature.

10. The charged particle beam apparatus according to claim 1 , wherein

the unit further includes a nitrogen gas cylinder that supplies a nitrogen gas through the valve, and

the controller supplies the nitrogen gas from the nitrogen gas cylinder through the valve.

11. The charged particle beam apparatus according to claim 1 , wherein

the cooling unit is disposed in the vicinity of a sample holder.

12. The charged particle beam apparatus according to claim 1 , wherein

the cooling unit is formed integrally with a sample holder.

13. A control method of a charged particle beam apparatus for cooling a cooling unit inside a vacuum application apparatus, the control method comprising steps of:

supplying a refrigerant from a cooling tank to the cooling unit, the cooling tank containing the refrigerant for cooling the cooling unit; and

controlling the refrigerant to liquefy when the refrigerant is biased to a solid;

maintaining the refrigerant in a solid-liquid coexisting state by controlling a valve to inject gas into the interior of the cooling tank to pressurize the interior of the cooling tank and controlling a pump to exhaust the interior of the cooling tank to depressurize the interior of the cooling tank based on a measured degree of vacuum; and

controlling operation of at least one of the pump and the valve when the measured degree of vacuum is a predetermined degree of vacuum.

Assignments (2)
CHANGE OF NAME Recorded May 14, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052662/0726 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 18, 2018
From: SUNAOSHI, TAKESHI; ORAI, YOSHIHISA; HATANO, HARUHIKO; MIZUO, TAKASHI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 045845/0378 →
Priority Claims (1)
WO PCT/JP2015/084360 · Dec 8, 2015 · international
Continuity (1)
Related Publication 20180350554A1 · Dec 6, 2018