Defect observation device
A defect observation device detects a defect with high accuracy regardless of a defect size. One imaging configuration for observing an observation target on a sample is selected from an optical microscope, an optical microscope, and an electron microscope, and an imaging condition of the selected imaging configuration is controlled.
1. A defect observation device comprising:
a first imaging unit that captures a plurality of defects detected by an external inspection device;
a control unit that corrects positional information on the defects by using an image captured by the first imaging unit; and
a scanning electron microscope configured with a second imaging function and comprising a second imaging unit that captures the defects based on the corrected position information,
wherein the first imaging unit includes a plurality of imaging portions,
the control unit selects one of the first imaging unit and the second imaging unit as a next imaging unit for each of the defects based on the information obtained by imaging the defect by the first imaging unit,
the control unit sets a next imaging portion of the first imaging unit from the plurality of imaging portions in the first imaging unit or an imaging condition of the second imaging unit,
the control unit sets an accumulation frame number, an acceleration voltage, a probe current, an imaging magnification or an imaging field of view as the imaging condition of the second aging unit, and
the control unit calculates a coordinate correction formula based on the positional information of the defect detected by the first imaging unit and the information obtained by an image acquired by the first imaging unit, and images the defect by using the second imaging unit based on the corrected positional information.
2. A defect observation device comprising:
a first imaging unit that captures a plurality of defects detected by an external inspection device;
a control unit that corrects positional information on the defects by using an image captured by the first imaging unit; and
a scanning electron microscope configured with a second imaging function and comprising a second imaging unit that captures the defects based on the corrected position information,
wherein the first imaging unit includes a plurality of imaging portions,
when it is determined that coordinate detection of the defect from the image captured by the first imaging unit is disabled, the control unit sets a next imaging portion of the first imaging unit from the plurality of imaging portions of the first imaging unit based on the information obtained by the image acquired by the first imaging unit of the imaging portion determined to be incapable of detecting the coordinates of the defect, and
the control unit calculates a coordinate correction formula based on the positional information of the defect detected by the first imaging unit and information obtained by the image acquired by the first imaging unit, and images the defect by using the second imaging unit based on the corrected positional information.
3. The defect observation device according to claim 2 ,
wherein the information obtained by the image acquired by the first imaging unit of the imaging portion, which is determined to be incapable of detecting the coordinates of the defect, includes:
information on the imaging portions of the first imaging unit;
an image feature amount obtained from the image captured by the first imaging unit; and
determination information on a defect image determined based on the information of the imaging portions and the image feature amount.
4. The defect observation device according to claim 3 , wherein the determination information of the defect image includes determination information as to whether or not an area of the defect image in the image captured by the first imaging unit is on an edge of the captured image.
5. The defect observation device according to claim 3 , wherein the determination information of the defect image includes determination information as to whether or not the defect image in the image captured by the first imaging unit is linear.
6. The defect observation device according to claim 3 , wherein the determination information of the defect image includes determination information as to whether or not a plurality of the defect images are present in the image captured by the first imaging unit.
7. The defect observation device according to claim 3 , wherein the determination information on the defect image includes determination information on a size of the defect image in the image captured by the first imaging unit.
8. The defect observation device according to claim 3 , wherein the control unit calculates the coordinate correction formula based on a detection result of the defect selected based on the determination information of the defect image.
9. The defect observation device according to claim 1 , wherein the information obtained by the image acquired by the first imaging unit includes:
information on the imaging portions of the first imaging unit,
an image feature amount obtained from the image captured by the first imaging unit, and
determination information on a defect image determined based on the information of the imaging portions and the image feature amount.
10. The defect observation device according to claim 9 , wherein the determination information of the defect image includes determination information as to whether or not an area of the defect image in the image captured by the first imaging unit is on an edge of the captured image.
11. The defect observation device according to claim 9 , wherein the determination information of the defect image includes determination information as to whether or not the defect image in the image captured by the first imaging unit is linear.
12. The defect observation device according to claim 9 , wherein the determination information of the defect image includes determination information as to whether or not a plurality of the defect images are present in the image captured by the first imaging unit.
13. The defect observation device according to claim 9 , wherein the determination information on the defect image includes determination information on a size of the defect image in the image captured by the first imaging unit.
14. The defect observation device according to claim 9 , wherein the control unit calculates the coordinate correction formula based on a detection result of the defect selected based on the determination information of the defect image.