IP Library › Assignment 048680/0284
Patent Assignment
Reel/Frame 048680/0284

Assignment of Assignor's Interest

Recorded: 2019-03-22 Pages: 4
Assignors
SHIGENO, MASATSUGU
Executed: 2019-03-11
YAMAMOTO, HIROYOSHI
Executed: 2019-03-11
WATANABE, KAZUTOSHI
Executed: 2019-03-11
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-0003, JAPAN
Covered Property (1)
Scanning Probe Microscope and Scanning Method Using the Same
Application: 16/362,095 →
Publication: US 2019/0293681
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH ANALYSIS CORPORATION
Reel/Frame 072905/0225 →
Chnage of Address Sep 17, 2025
From: HITACHI HIGH-TECH SCIENCE CORPORATION
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 072909/0725 →