Assignment of Assignor's Interest

Recorded: 2019-04-25 Pages: 2

Assignors

ZHANG, QIANG

Executed: 2019-04-23

CHEN, GRACE H.

Executed: 2019-04-23

Assignee

KLA-TENCOR CORPORATION

ONE TECHNOLOGY DRIVE, MILPITAS, CALIFORNIA, 95035

Covered Properties (2)

Correlating Sem and Optical Images for Wafer Noise Nuisance Identification

Patent: 10,697,900 →

Application: 16/394,723 →

Publication: US 2019/0383753

Method of Correlating SEM and Optical Images for Wafer Noise Nuisance Identification

Application: 62/687,192 →