IP Library › Patent Application 62687192
Patent Application Provisional
App. No. 62/687,192 · Confirmation No. 2201

Method of Correlating SEM and Optical Images for Wafer Noise Nuisance Identification

Provisional Application Expired
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 Code Description Pages PDF
2018-06-25 APP.FILE.REC Filing Receipt 3 View
2018-06-19 TR.PROV Provisional Cover Sheet (SB16) 3 View
2018-06-19 SPEC Specification 4 View
2018-06-19 WFEE Fee Worksheet (SB06) 2 View
2018-06-19 N417 Electronic Filing System Acknowledgment Receipt 2 View
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Quick Facts
App. No.
62/687,192
Filed
2018-06-19