Patent Assignment
Reel/Frame 049046/0013
Assignment of Assignor's Interest
Recorded: 2019-05-01
Pages: 2
Assignee
HAMAMATSU PHOTONICS K.K.
1126-1, ICHINO-CHO, HIGASHI-KU, HAMAMATSU-SHI, SHIZUOKA, 435-8558, JAPAN
Covered Property
(1)
Semiconductor Device Inspection Apparatus and Semiconductor Device Inspection Method