Patent Assignment
Reel/Frame 049658/0837
Assignment of Assignor's Interest
Recorded: 2019-07-02
Pages: 8
Assignors
BIZEN, DAISUKE
Executed: 2019-06-10
TSUNO, NATSUKI
Executed: 2019-06-12
MIWA, TAKAFUMI
Executed: 2019-06-07
SAKAKIBARA, MAKOTO
Executed: 2019-06-12
YOKOSUKA, TOSHIYUKI
Executed: 2019-06-07
KAZUMI, HIDEYUKI
Executed: 2019-06-07
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-8717, JAPAN
Covered Property
(1)
Scanning Electron Microscope and Sample Observation Method Using Scanning Electron Microscope
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.