Patent Assignment
Reel/Frame 050098/0219
Assignment of Assignor's Interest
Recorded: 2019-08-20
Pages: 4
Assignor
NOGUCHI, SHUNSUKE
Executed: 2019-08-05
Assignee
SHOWA DENKO K.K.
13-9, SHIBADAIMON 1-CHOME, MINATO-KU, TOKYO, 105-8518, JAPAN
Covered Property
(1)
SiC SUBSTRATE EVALUATION METHOD, SiC EPITAXIAL WAFER MANUFACTURING METHOD, AND SiC EPITAXIAL WAFER
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.