Patent Assignment
Reel/Frame 050369/0363
Assignment of Assignor's Interest
Recorded: 2019-09-13
Pages: 6
Assignors
KONDO, NAOAKI
Executed: 2019-08-06
HARADA, MINORU
Executed: 2019-08-06
TAKAGI, YUJI
Executed: 2019-08-06
HIRAI, TAKEHIRO
Executed: 2019-08-06
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-8717, JAPAN
Covered Property
(1)
Defect Observation Device and Defect Observation Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.