Patent Assignment
Reel/Frame 052605/0527
Assignment of Assignor's Interest
Recorded: 2020-05-07
Pages: 3
Assignee
NANYA TECHNOLOGY CORPORATION
NO.98, NANLIN RD., TAISHAN DIST., NEW TAIPEI CITY, 243, TAIWAN
Covered Property
(1)
Test Array Structure, Wafer Structure and Wafer Testing Method