IP Library Assignment 053129/0536
Patent Assignment
Reel/Frame 053129/0536

Assignment of Assignor's Interest

Recorded: 2020-07-06 Pages: 9
Assignors
UPPALURI, PRASANTI
Executed: 2017-01-26
MANEPALLI, RAJESH
Executed: 2017-01-30
KULKARNI, ASHOK V.
Executed: 2017-02-16
BANERJEE, SAIBAL
Executed: 2017-03-13
KIRKLAND, JOHN
Executed: 2017-02-23
Assignee
KLA-TENCOR CORPORATION
ONE TECHNOLOGY DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Property (1)
System and Method for Generation of Wafer Inspection Critical Areas
Application: 16/921,812 →
Publication: US 2020/0334807
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jun 22, 2022
From: KLA-TENCOR CORPORATION
To: KLA CORPORATION
Reel/Frame 060392/0340 →