IP Library › Assignment 060392/0340
Patent Assignment
Reel/Frame 060392/0340

Change of Name

Recorded: 2022-06-22 Pages: 3
Assignor
KLA-TENCOR CORPORATION
Executed: 2019-06-19
Assignee
KLA CORPORATION
ONE TECHNOLOGY DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Property (1)
System and Method for Generation of Wafer Inspection Critical Areas
Application: 16/921,812 →
Publication: US 2020/0334807
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jul 6, 2020
From: UPPALURI, PRASANTI; MANEPALLI, RAJESH; KULKARNI, ASHOK V.; BANERJEE, SAIBAL
To: KLA-TENCOR CORPORATION
Reel/Frame 053129/0536 →