Patent Assignment
Reel/Frame 053721/0520
Assignment of Assignor's Interest
Recorded: 2020-09-09
Pages: 4
Assignors
KOHASHI, TERUO
Executed: 2020-07-08
MORISHITA, HIDEO
Executed: 2020-06-29
KATANE, JUNICHI
Executed: 2020-07-08
Assignee
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Scanning Electron Microscope and Method for Analyzing Secondary Electron Spin Polarization