Patent Assignment
Reel/Frame 055930/0471
Assignment of Assignor's Interest
Recorded: 2021-04-15
Pages: 2
Assignors
HIROI, TAKASHI
Executed: 2021-02-19
HIROSE, NOBUAKI
Executed: 2021-02-16
URANO, TAKAHIRO
Executed: 2021-02-19
Assignee
HITACHI HIGH-TECH CORPORATION
17-1, TORANOMON 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Defect Inspection Device and Defect Inspection Method