IP Library Assignment 057561/0210
Patent Assignment
Reel/Frame 057561/0210

Assignment of Assignor's Interest

Recorded: 2021-09-22 Pages: 8
Assignors
KANG, MIN-CHEOL
Executed: 2021-06-02
SIM, WOOJOO
Executed: 2021-06-14
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property (1)
Device and Method for Detecting Defects on Wafer
Application: 17/465,179 →
Publication: US 2022/0108436
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 22, 2021
From: KIM, DO-NYUN; KIM, JAEHOON
To: SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION
Reel/Frame 057561/0309 →