Patent Assignment
Reel/Frame 057561/0309
Assignment of Assignor's Interest
Recorded: 2021-09-22
Pages: 8
Assignee
SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION
1, GWANAK-RO, GWANAK-GU,, SEOUL, 08826, KOREA, REPUBLIC OF
Covered Property
(1)
Device and Method for Detecting Defects on Wafer
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.