IP Library › Assignment 057641/0109
Patent Assignment
Reel/Frame 057641/0109

Corrective Assignment to Correct the Country in Assignee Address Previously Recorded at Reel: 47628 Frame: 787. Assignor(S) Hereby Confirms the Assignment.

Recorded: 2021-07-15 Pages: 6
Assignors
LEE, HIDEOK
Executed: 2018-11-26
OH, DONGJUN
Executed: 2018-11-26
KWON, SUNGKYU
Executed: 2018-11-26
SONG, HYEONGSUB
Executed: 2018-11-26
KIM, SOYEONG
Executed: 2018-11-26
Assignee
THE INDUSTRY & ACADEMIC COOPERATION IN CHUNGNAM NATIONAL UNIVERSITY (IAC)
99, DAEHAK-RO, YUSEONG-GU, DAEJEON, 34134, KOREA, REPUBLIC OF
Covered Property (1)
Semiconductor Device for Testing Characteristics of Transistors and Method for Testing Semiconductor Device
Application: 16/204,867 →
Publication: US 2019/0172829
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Nov 29, 2018
From: LEE, HIDEOK; OH, DONGJUN; KWON, SUNGKYU; SONG, HYEONGSUB
To: THE INDUSTRY & ACADEMIC COOPERATION IN CHUNGNAM NATIONAL UNIVERSITY (IAC)
Reel/Frame 047628/0787 →