Semiconductor device for testing characteristics of transistors and method for testing semiconductor device
A semiconductor device for evaluating characteristics of a transistor is provided. The semiconductor device includes a substrate, an active area defined on the substrate, an insulated gate configured to be formed on the active area, a first source layer and a first drain layer configured to be formed on the active area in a first two-way direction of the gate, and a second source layer and a second drain layer configured to be formed on the active area in a second two-way direction of the gate. The first source layer, the first drain layer, and the second drain layer are formed as a first conductive type. The second source layer is formed as a second conductive type.
1. A semiconductor device, comprising:
a first transistor configured to be driven in a first mode; and
a second transistor configured to be driven in a second mode different from the first mode,
wherein the first transistor and the second transistor share the same channel layer and the same gate, and
wherein the first transistor is a tunneling field effect transistor (TFET) and the second transistor is a metal oxide semiconductor field effect transistor (MOSFET).
2. A semiconductor device, comprising:
a substrate;
an active area defined on the substrate;
an insulated gate configured to be formed on the active area;
a first source layer and a first drain layer configured to be formed on the active area in a first two-way direction of the gate; and
a second source layer and a second drain layer configured to be formed on the active area in a second two-way direction of the gate,
wherein each of the first source layer, the first drain layer, and the second drain layer is formed as a first conductive type, and
wherein the second source layer is formed as a second conductive type,
wherein the first source layer and the first drain layer are driven as a metal oxide semiconductor field effect transistor (MOSFET),
wherein the second source layer and the second drain layer are driven as a tunneling field effect transistor (TFET).
3. The semiconductor device of claim 2 , further comprising:
a first source electrode, a first drain electrode, a second source electrode, and a second drain electrode configured to be electrically connected with the first source layer, the first drain layer, the second source layer, and the second drain layer, respectively,
wherein each of the first source electrode, the first drain electrode, the second source electrode, and the second drain electrode comprises:
a first electrode member configured to be electrically connected with a corresponding source layer and drain layer formed on the active area and be extended horizontally outward from the semiconductor device;
a first electrode pad configured to be formed on a location which is not adjacent to the first electrode member; and
a second electrode member configured to be electrically connected with one end of the first electrode member and one end of the first electrode pad and have a width narrower than the first electrode member and the first electrode pad.
4. The semiconductor device of claim 2 , wherein the insulated gate is formed larger in width than the active area where the first source layer, the first drain layer, the second source layer, and the second drain layer are formed.
5. The semiconductor device of claim 2 , further comprising:
a controller configured to have a first mode for forming a first channel between the first source layer and the first drain layer in the active area and have a second mode for forming a second channel between the second source layer and the second drain layer in the active area,
wherein the first channel and the second channel are selectively formed.
6. A semiconductor test pattern, comprising:
a substrate;
an active area of a cross form, the active area being defined on the substrate;
a gate configured to be located on a central portion of the active area;
a gate insulating film configured to be located between the gate and the central portion of the active area; and
four impurity regions formed on the active area outside the gate,
wherein any one of the four impurity regions is formed as a first conductive type, and
wherein each of the other impurity regions is formed as a second conductive type,
wherein two of the other impurity regions are driven as a metal oxide semiconductor field effect transistor (MOSFET),
wherein the impurity region formed of the first conductive type and the impurity region formed the second conductive type are driven as a tunneling field effect transistor (TFET).
7. The semiconductor test pattern of claim 6 , wherein the gate is formed larger in width than the active area where the impurity are formed.