Patent Assignment
Reel/Frame 058225/0203
Assignment of Assignor's Interest
Recorded: 2021-11-29
Pages: 4
Assignee
MITSUBISHI ELECTRIC CORPORATION
7-3, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO, 100-8310, JAPAN
Covered Property
(1)
Semiconductor Test Apparatus and Semiconductor Test Method