Patent Assignment
Reel/Frame 060123/0929
Assignment of Assignor's Interest
Recorded: 2022-06-07
Pages: 4
Assignors
HIRANO, RYOICHI
Executed: 2022-05-09
YAMASHITA, YASUHIRO
Executed: 2022-05-09
INOUE, HIROMU
Executed: 2022-05-09
Assignee
NUFLARE TECHNOLOGY, INC.
8-1, SHINSUGITA-CHO, ISOGO-KU, YOKOHAMA-SHI, KANAGAWA, 235-8522, JAPAN
Covered Property
(1)
Pattern Inspection Apparatus and Pattern Inspection Method Inspecting a Pattern Using an Image Corrected Using Offset Amount Based Upon Dark Noise Levels