IP Library › Assignment 061548/0431
Patent Assignment
Reel/Frame 061548/0431

Assignment of Assignor's Interest

Recorded: 2022-10-26 Pages: 3
Assignor
UNIVERSITEIT VAN AMSTERDAM
Executed: 2020-08-31
Assignee
ASML NETHERLANDS B.V.
P.O. BOX 324, VELDHOVEN, 5500 AH, NETHERLANDS
Covered Property (1)
Metrology System and Method for Determining a Characteristic of One or More Structures on a Substrate
Application: 17/856,213 →
Publication: US 2023/0062585
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Oct 26, 2022
From: TINNEMANS, PATRICIUS ALOYSIUS JACOBUS; BOEF, ARIE JEFFREY DEN; KOOLEN, ARMAND EUGENE ALBERT; PANDEY, NITESH
To: ASML NETHERLANDS B.V.
Reel/Frame 061548/0347 →
Assignment of Assignor's Interest Oct 26, 2022
From: VU, STICHTING; TENNER, VASCO TOMAS
To: ASML NETHERLANDS B.V.
Reel/Frame 061548/0368 →
Assignment of Assignor's Interest Oct 26, 2022
From: STICHTING NEDERLANDSE WETENSCHAPPELIJK ONDERZOEK INSTITUTEN
To: ASML NETHERLANDS B.V.
Reel/Frame 061548/0408 →